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表面阿秒条纹数据价带重构方法的研究。

Investigation of valence band reconstruction methods for attosecond streaking data from surfaces.

作者信息

Drmota P, Greening D, Marangos J P, Tisch J W G

出版信息

Opt Express. 2019 Apr 1;27(7):9394-9402. doi: 10.1364/OE.27.009394.

Abstract

We analyze simulated streaked valence band photoemission with atomic streaking theory-based reconstruction methods to investigate the differences between atomic gas-phase streaking and valence band surface streaking. The careful distinction between atomic and surface streaking is a prerequisite to justify the application of atomic streaking theory-based reconstruction methods to surface streaking measurements. We show that neglecting the band structure underestimates the width of reconstructed photoelectron wavepackets, consistent with the Fourier transform limit of the band spectrum. We find that a fit of Gaussian wavepackets within the description of atomic streaking is adequate to a limited extent. Systematic errors that depend on the near-infrared skin depth, an inherently surface-specific property, are present in temporal widths of wavepackets reconstructed with atomic streaking theory-based methods.

摘要

我们使用基于原子条纹理论的重建方法分析模拟的条纹价带光电子能谱,以研究原子气相条纹和价带表面条纹之间的差异。仔细区分原子条纹和表面条纹是将基于原子条纹理论的重建方法应用于表面条纹测量的前提。我们表明,忽略能带结构会低估重建光电子波包的宽度,这与能带谱的傅里叶变换极限一致。我们发现,在原子条纹描述范围内对高斯波包进行拟合在一定程度上是足够的。在用基于原子条纹理论的方法重建的波包时间宽度中存在依赖于近红外趋肤深度(一种固有的表面特定属性)的系统误差。

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