De Padova Paola, Generosi Amanda, Paci Barbara, Ottaviani Carlo, Quaresima Claudio, Olivieri Bruno, Kopciuszyński Marek, Żurawek Lucyna, Zdyb Ryszard, Krawiec Mariusz
Consiglio Nazionale delle Ricerche-ISM, Via Fosso del Cavaliere 100, 00133 Roma, Italy.
INFN-Laboratori Nazionali di Frascati Via Enrico Fermi 40, Frascati, 00044 Roma, Italy.
Materials (Basel). 2019 Jul 13;12(14):2258. doi: 10.3390/ma12142258.
We report new findings on multilayer silicene grown on Si(111)√3 × √3 R30°-Ag template, after the recent first compelling experimental evidence of its synthesis. Low-energy electron diffraction, reflection high-energy electron diffraction, and energy-dispersive grazing incidence X-ray diffraction measurements were performed to show up the fingerprints of √3 × √3 multilayer silicene. Angle-resolved photoemission spectroscopy displayed new features in the second surface Brillouin zone, attributed to the multilayer silicene on Si(111)√3 × √3 R30°-Ag. Band-structure dispersion theoretical calculations performed on a model of three honeycomb stacked layers, silicene grown on Si(111)√3 × √3 R30°-Ag surface confirm the experimental results.
在最近首次获得多层硅烯合成的确凿实验证据之后，我们报告了在Si(111)√3 × √3 R30°-Ag模板上生长的多层硅烯的新发现。进行了低能电子衍射、反射高能电子衍射和能量色散掠入射X射线衍射测量，以揭示√3 × √3多层硅烯的特征。角分辨光电子能谱在第二表面布里渊区显示出新特征，这归因于Si(111)√3 × √3 R30°-Ag上的多层硅烯。对三层蜂窝堆叠层模型进行的能带结构色散理论计算表明，在Si(111)√3 × √3 R30°-Ag表面生长的硅烯证实了实验结果。
