利用3D计算机图形对反射式高能电子衍射图案进行简化测定及其解释

Simplified Determination of RHEED Patterns and Its Explanation Shown with the Use of 3D Computer Graphics.

作者信息

Kokosza Łukasz, Pawlak Jakub, Mitura Zbigniew, Przybylski Marek

机构信息

Faculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland.

Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Kraków, Poland.

出版信息

Materials (Basel). 2021 Jun 3;14(11):3056. doi: 10.3390/ma14113056.

DOI:10.3390/ma14113056

PMID:34205158

原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8199926/

Abstract

The process of preparation of nanostructured thin films in high vacuum can be monitored with the help of reflection high energy diffraction (RHEED). However, RHEED patterns, both observed or recorded, need to be interpreted. The simplest approaches are based on carrying out the Ewald construction for a set of rods perpendicular to the crystal surface. This article describes how the utilization of computer graphics may be useful for realistic reproduction of experimental conditions, and then for carrying out the Ewald construction in a reciprocal 3D space. The computer software was prepared in the Java programing language. The software can be used to interpret real diffractions patterns for relatively flat surfaces, and thus it may be helpful in broad research practice.

摘要

在高真空环境中制备纳米结构薄膜的过程可以借助反射高能衍射（RHEED）进行监测。然而，无论是观察到的还是记录下来的RHEED图案都需要进行解读。最简单的方法是基于对一组垂直于晶体表面的棒进行埃瓦尔德构图。本文描述了如何利用计算机图形学来逼真地再现实验条件，进而在倒易三维空间中进行埃瓦尔德构图。该计算机软件是用Java编程语言编写的。该软件可用于解释相对平坦表面的真实衍射图案，因此在广泛的研究实践中可能会有所帮助。