Zhao Qiang, Miao Jiahao, Zhou Shengjun, Gui Chengqun, Tang Bin, Liu Mengling, Wan Hui, Hu Jinfeng
The Institute of Technological Sciences, Wuhan University, Wuhan 430072, China.
Center for Photonics and Semiconductors, School of Power and Mechanical Engineering, Wuhan University, Wuhan 430072, China.
Nanomaterials (Basel). 2019 Aug 17;9(8):1178. doi: 10.3390/nano9081178.
We demonstrate high-power GaN-based vertical light-emitting diodes (LEDs) (VLEDs) on a 4-inch silicon substrate and flip-chip LEDs on a sapphire substrate. The GaN-based VLEDs were transferred onto the silicon substrate by using the Au-In eutectic bonding technique in combination with the laser lift-off (LLO) process. The silicon substrate with high thermal conductivity can provide a satisfactory path for heat dissipation of VLEDs. The nitrogen polar n-GaN surface was textured by KOH solution, which not only improved light extract efficiency (LEE) but also broke down Fabry-Pérot interference in VLEDs. As a result, a near Lambertian emission pattern was obtained in a VLED. To improve current spreading, the ring-shaped n-electrode was uniformly distributed over the entire VLED. Our combined numerical and experimental results revealed that the VLED exhibited superior heat dissipation and current spreading performance over a flip-chip LED (FCLED). As a result, under 350 mA injection current, the forward voltage of the VLED was 0.36 V lower than that of the FCLED, while the light output power (LOP) of the VLED was 3.7% higher than that of the FCLED. The LOP of the FCLED saturated at 1280 mA, but the light output saturation did not appear in the VLED.
我们展示了在4英寸硅衬底上的高功率氮化镓基垂直发光二极管(VLED)以及在蓝宝石衬底上的倒装芯片发光二极管。基于氮化镓的VLED通过使用金 - 铟共晶键合技术结合激光剥离(LLO)工艺转移到硅衬底上。具有高导热率的硅衬底可为VLED的散热提供令人满意的路径。通过KOH溶液对氮极性n - GaN表面进行纹理化处理,这不仅提高了光提取效率(LEE),还消除了VLED中的法布里 - 珀罗干涉。结果,在VLED中获得了近朗伯发射模式。为了改善电流扩展,环形n电极均匀分布在整个VLED上。我们的数值和实验相结合的结果表明,与倒装芯片发光二极管(FCLED)相比,VLED表现出卓越的散热和电流扩展性能。因此,在350 mA注入电流下,VLED的正向电压比FCLED低0.36 V,而VLED的光输出功率(LOP)比FCLED高3.7%。FCLED的LOP在1280 mA时饱和,但VLED中未出现光输出饱和现象。