Bai Yu, Wang Zhan Jie, He Bin, Cui Jian Zhong, Zhang Zhi Dong
School of Materials Science and Engineering, Northeastern University, No. 3-11 Wenhua Road, Heping District, Shenyang 110819, China.
Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenhe District, Shenyang 110016, China.
ACS Omega. 2017 Dec 18;2(12):9067-9073. doi: 10.1021/acsomega.7b01626. eCollection 2017 Dec 31.
Ferroelectric thin films have been extremely studied for many applications such as nonvolatile memories, super capacitors, and solar cells. For these devices, improving the polarization properties of ferroelectric thin films is of great significance to their performance. Here, Au-lead zirconate titanate (PZT) nanocomposite thin films were prepared by a simple one-step chemical solution deposition (CSD) method on silicon substrates, and the effects of Au concentration on the ferroelectric properties were investigated. The experimental results show that the remanent polarization of the Au-PZT films with 1.2 mol % Au is about 80 μC/cm, which is 50% higher than that of the pure PZT thin films. On the basis of the analysis of chemical valences, the enhanced polarization properties can be ascribed to the interaction between Au nanoparticles (Au NPs) and PZT at the Au-PZT interfaces. Our results demonstrate that the incorporation of an appropriate amount of Au NPs is an effective way to enhance the polarization properties of ferroelectric films. The Au-PZT nanocomposite thin films with excellent polarization properties on silicon substrates are expected to be widely used in integrated ferroelectric devices.
铁电薄膜已被广泛研究用于许多应用,如非易失性存储器、超级电容器和太阳能电池。对于这些器件而言,改善铁电薄膜的极化特性对其性能具有重要意义。在此,通过简单的一步化学溶液沉积(CSD)方法在硅衬底上制备了金-锆钛酸铅(PZT)纳米复合薄膜,并研究了金浓度对铁电性能的影响。实验结果表明,金含量为1.2 mol%的金-PZT薄膜的剩余极化强度约为80 μC/cm,比纯PZT薄膜高50%。基于化合价分析,极化特性的增强可归因于金纳米颗粒(Au NPs)与金-PZT界面处的PZT之间的相互作用。我们的结果表明,掺入适量的金纳米颗粒是增强铁电薄膜极化特性的有效方法。有望在硅衬底上具有优异极化特性的金-PZT纳米复合薄膜广泛应用于集成铁电器件。