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金辅助硅化学蚀刻的非线性蚀刻速率

Nonlinear Etch Rate of Au-Assisted Chemical Etching of Silicon.

作者信息

Choi Keorock, Song Yunwon, Ki Bugeun, Oh Jungwoo

机构信息

School of Integrated Technology, Yonsei University, 85 Songdokwahak-ro, Yeonsu-gu, Incheon 21983, Republic of Korea.

Yonsei Institute of Convergence Technology, 85 Songdogwahak-ro, Yeonsu-gu, Incheon 21983, Republic of Korea.

出版信息

ACS Omega. 2017 May 16;2(5):2100-2105. doi: 10.1021/acsomega.7b00232. eCollection 2017 May 31.

Abstract

We demonstrated time-dependent mass transport mechanisms of Au-assisted chemical etching of Si substrates. Variations in the etch rate and surface topology were correlated with catalyst features and etching duration. Nonlinear etching characteristics were associated with the formation of pinholes and whiskers. Variable rates of mass transport as a function of whisker density accounted for the nonlinear etch rates of Si. Nanopinholes on Au catalysts facilitated the vertical mass transport of reactants and byproducts, which dramatically changed the etch rate, surface topology, and porosity of Si. The suggested transport models describe the transient mass transport and the corresponding chemical reactions.

摘要

我们展示了金辅助化学蚀刻硅衬底的时间相关质量传输机制。蚀刻速率和表面拓扑结构的变化与催化剂特性和蚀刻持续时间相关。非线性蚀刻特性与针孔和晶须的形成有关。作为晶须密度函数的可变质量传输速率解释了硅的非线性蚀刻速率。金催化剂上的纳米针孔促进了反应物和副产物的垂直质量传输,这极大地改变了硅的蚀刻速率、表面拓扑结构和孔隙率。所提出的传输模型描述了瞬态质量传输和相应的化学反应。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/3dd5/6641051/2e579797a7bc/ao-2017-002324_0001.jpg

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