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NSLS-II 的 TES 光束线(8-BM):低能空间分辨 X 射线吸收光谱和 X 射线荧光成像。

The TES beamline (8-BM) at NSLS-II: tender-energy spatially resolved X-ray absorption spectroscopy and X-ray fluorescence imaging.

机构信息

National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA.

出版信息

J Synchrotron Radiat. 2019 Nov 1;26(Pt 6):2064-2074. doi: 10.1107/S1600577519012761. Epub 2019 Oct 18.

DOI:10.1107/S1600577519012761
PMID:31721752
Abstract

The tender-energy X-ray spectroscopy (TES) beamline at the National Synchrotron Light Source II (NSLS-II) is now operational for general users. Its scientific mission includes static and in situ X-ray fluorescence imaging and spatially resolved X-ray absorption spectroscopy for characterization of complex heterogeneous, structured and dynamic natural or engineered materials and systems. TES is optimized for the tender-energy range, offering routine operations from 2.0 to 5.5 keV, with capabilities to reach down to 1.2 or up to 8 keV with configuration change. TES is designed as an extended X-ray absorption fine-structure microprobe (EXAFS microprobe) for applications of micrometre-scale EXAFS spectroscopy to heterogeneous samples. Beam size is user-tunable from ∼2 to 25 µm. Energy may be scanned on-the-fly or in traditional step scanning. Importantly, the position of the microbeam at the sample location does not move significantly during energy scanning or when changing energy across the entire routine energy range. This enables full EXAFS of a particle or domain the same size as the probe beam, and measurement of the same spot at different energies. In addition, there is no measureable drift in energy calibration (repeatability) scan-to-scan and over 24 h. This is critical where simultaneous calibration measurements are generally not feasible, and for speciation mapping where precise and stable control of incident energy is essential. The sample environment is helium atmosphere at room pressure with infrastructure for in situ electrochemistry and catalysis in small sample cells or microreactors. As the first bend-magnet beamline at NSLS-II, noteworthy commissioning aspects are described. Example measurements are presented to illustrate its capabilities.

摘要

国家同步辐射光源二期(NSLS-II)的软 X 射线能谱学(TES)光束线现已向普通用户开放。其科学任务包括静态和原位 X 射线荧光成像以及空间分辨 X 射线吸收光谱学,用于对复杂的异质、结构化和动态的天然或工程材料和系统进行表征。TES 针对软 X 射线能区进行了优化,常规操作范围为 2.0 至 5.5 keV,通过配置改变,可扩展至 1.2 或 8 keV。TES 设计为扩展 X 射线吸收精细结构微探针(EXAFS 微探针),用于对异质样品进行微尺度 EXAFS 光谱学应用。光束尺寸可由用户在 2 至 25 µm 之间调节。能量可实时或传统分步扫描。重要的是,在能量扫描或跨整个常规能量范围改变能量时,微光束在样品位置处的位置不会显著移动。这使得相同尺寸的探针光束能够对一个粒子或一个域进行完整的 EXAFS 测量,并能在不同能量下对同一位置进行测量。此外,在能量扫描中,能量校准(重复性)无明显漂移,在 24 小时以上也无漂移。在同步校准测量通常不可行的情况下,以及在需要精确和稳定控制入射能量的形态分析中,这一点至关重要。样品环境为室温下的氦气气氛,具有用于原位电化学和小样品池或微反应器中催化的基础设施。作为 NSLS-II 的第一条弯铁光束线,描述了值得注意的调试方面。给出了一些示例测量,以说明其能力。

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