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氮化镓基半导体的中子探测性能。

Neutron detection performance of gallium nitride based semiconductors.

作者信息

Zhou Chuanle, Melton Andrew G, Burgett Eric, Hertel Nolan, Ferguson Ian T

机构信息

Department of Electrical and Computer Engineering, Missouri University of Science and Technology, Missouri, 65409, USA.

Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, North Carolina, 28223, USA.

出版信息

Sci Rep. 2019 Nov 26;9(1):17551. doi: 10.1038/s41598-019-53664-7.

Abstract

Neutron detection is crucial for particle physics experiments, nuclear power, space and international security. Solid state neutron detectors are of great interest due to their superior mechanical robustness, smaller size and lower voltage operation compared to gas detectors. Gallium nitride (GaN), a mature wide bandgap optoelectronic and electronic semiconductor, is attracting research interest for neutron detection due to its radiation hardness and thermal stability. This work investigated thermal neutron scintillation detectors composed of GaN thin films with and without conversion layers or rare-earth doping. Intrinsic GaN-based neutron scintillators are demonstrated via the intrinsic N(n, p) reaction, which has a small thermal neutron cross-section at low neutron energies, but is comparable to other reactions at high neutron energies (>1 MeV). Gamma discrimination is shown to be possible with pulse-height in intrinsic GaN-based scintillation detectors. Additionally, GaN-based scintillation detector with a LiF neutron conversion layer and Gd-doped GaN detector are compared with intrinsic GaN detectors. These results indicate GaN scintillator is a suitable candidate neutron detector in high-flux applications.

摘要

中子探测对于粒子物理实验、核能、太空及国际安全至关重要。与气体探测器相比,固态中子探测器因其卓越的机械坚固性、更小的尺寸以及更低的工作电压而备受关注。氮化镓(GaN)是一种成熟的宽带隙光电子和电子半导体,因其辐射硬度和热稳定性,在中子探测方面正吸引着研究兴趣。这项工作研究了由有或没有转换层或稀土掺杂的GaN薄膜组成的热中子闪烁探测器。通过本征N(n, p)反应展示了本征GaN基中子闪烁体,该反应在低中子能量下热中子截面较小,但在高中子能量(>1 MeV)时与其他反应相当。结果表明,基于本征GaN的闪烁探测器可以通过脉冲高度实现伽马甄别。此外,还将具有LiF中子转换层的GaN基闪烁探测器和掺钆GaN探测器与本征GaN探测器进行了比较。这些结果表明,GaN闪烁体是高通量应用中合适的候选中子探测器。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/5fba/6879627/eab5a78c13e5/41598_2019_53664_Fig1_HTML.jpg

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