Ahad Abdul, Shukla D K
Department of Physics, Aligarh Muslim University, Aligarh 202002, India.
UGC-DAE Consortium for Scientific Research, Indore 452001, India.
Rev Sci Instrum. 2019 Nov 1;90(11):116101. doi: 10.1063/1.5116160.
A setup is designed for measuring the Seebeck coefficient (S) of materials in the form of thin films, bars, and wires. The main feature of this setup is its control in heating and cooling cycles. In this setup, a heat pulse is used to generate the temperature gradient. To demonstrate the capabilities of this setup, S versus T of standard wire samples such as Au-Fe (0.07%), chromel, Pt, and thin films of Pt and F doped SnO are presented. The standard uncertainty of the repeatability in the S measurement is found to be ∼±0.056 μV/K while the temperature stability is ∼±10 mK (at 320 K), estimated for a chromel wire sample. We have tested the setup in the temperature range 100 K-320 K, while it does not have any intrinsic limitations in going down to liquid He temperatures. For temperatures above 320 K, the limitation is due to gluing materials such as varnish.
