Parab Virendra, Prasad Oppili, Pillai Sreelal, Sambandan Sanjiv
Department of Instrumentation and Applied Physics, Indian Institute of Science, Bangalore, 560012, India.
Centre for Nanoscience and Engineering, Indian Institute of Science, Instrumentation and Applied Physics, Bangalore, 560012, India.
Sci Rep. 2019 Dec 23;9(1):19700. doi: 10.1038/s41598-019-55801-8.
Open circuit faults in electronic systems are a common failure mechanism, particularly in large area electronic systems such as display and image sensor arrays, flexible electronics and wearable electronics. To address this problem several methods to self heal open faults in real time have been investigated. One approach of interest to this work is the electric field assisted self-healing (eFASH) of open faults. eFASH uses a low concentration dispersion of conductive particles in an insulating fluid that is packaged over the interconnect. The electric field appearing in the open fault in a current carrying interconnect polarizes the conductive particles and chains them up to create a heal. This work studies the impact of dispersion concentration on the heal time, heal impedance and cross-talk when eFASH is used for self-healing. Theoretical predictions are supported by experimental evidence and an optimum dispersion concentration for effective self-healing is identified.
电子系统中的开路故障是一种常见的失效机制,在诸如显示和图像传感器阵列、柔性电子器件及可穿戴电子器件等大面积电子系统中尤为常见。为解决这一问题,人们研究了几种实时自愈开路故障的方法。本工作感兴趣的一种方法是开路故障的电场辅助自修复(eFASH)。eFASH使用一种在绝缘流体中的低浓度导电颗粒分散体,该分散体封装在互连上。在载流互连线中的开路故障中出现的电场使导电颗粒极化并将它们连接成链以实现修复。这项工作研究了在使用eFASH进行自修复时,分散体浓度对修复时间、修复阻抗和串扰的影响。理论预测得到了实验证据的支持,并确定了有效自修复的最佳分散体浓度。