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物理激发磷光体板伪影对根尖周炎症性疾病放射学解读的影响。

The effects of physical photostimulable phosphor plate artifacts on the radiologic interpretation of periapical inflammatory disease.

机构信息

Faculty of Dentistry, University of Toronto, Toronto, Canada.

Faculty of Dentistry, University of Toronto, Toronto, Canada.

出版信息

Oral Surg Oral Med Oral Pathol Oral Radiol. 2020 Jun;129(6):621-628. doi: 10.1016/j.oooo.2019.11.001. Epub 2019 Nov 6.

DOI:10.1016/j.oooo.2019.11.001
PMID:31983634
Abstract

OBJECTIVE

To evaluate how physical photostimulable phosphor (PSP) plate artifacts, such as those created by scratches, phosphor degradation, and surface peeling, affect the radiologic interpretation of periapical inflammatory disease.

STUDY DESIGN

A novel technique was developed to digitally superimpose 25 real PSP artifact masks over 100 clinical complementary metal oxide semiconductor (CMOS) periapical images with known radiologic interpretations. These images were presented to 25 general dentists, who were asked to state their radiologic interpretations, their confidence in their interpretations, and their opinions on whether the plates should be discarded. Statistical analyses were conducted by using random intercept mixed models for repeated measures and χ tests of the pooled data.

RESULTS

No statistically significant adverse effect on interpretation was seen, even at severe artifact levels. There was a statistically significant decrease in the clinicians' confidence and an increase in discard proportions when interpreting images with severe PSP plate artifacts (P < .05).

CONCLUSIONS

Although diagnostic efficacy was unaffected, clinicians' confidence decreased and proportionally more clinicians opted to discard sensors when interpreting images with severe artifacts. Future studies on the effects of artifacts on the efficacy of diagnosis of other dental diseases are recommended. Ultimately, these results can guide recommendations for PSP plate quality assurance.

摘要

目的

评估物理光激励磷光体 (PSP) 板伪影(如划痕、磷光体降解和表面剥落造成的伪影)如何影响根尖炎性疾病的放射学解读。

研究设计

开发了一种新的技术,将 25 个真实的 PSP 伪影掩模数字叠加在 100 个具有已知放射学解释的临床互补金属氧化物半导体 (CMOS) 根尖图像上。这些图像呈现给 25 名普通牙医,要求他们陈述自己的放射学解释、对这些解释的信心以及他们对是否应丢弃这些平板的看法。使用随机截距混合模型进行重复测量和汇总数据的 χ 检验进行统计分析。

结果

即使在严重伪影水平下,也未观察到对解释有统计学显著的不利影响。当解释具有严重 PSP 平板伪影的图像时,临床医生的信心有统计学显著下降,并且丢弃比例增加(P<0.05)。

结论

虽然诊断效果不受影响,但当解释具有严重伪影的图像时,临床医生的信心下降,并且更多的医生选择丢弃传感器。建议开展关于伪影对其他牙科疾病诊断效果影响的进一步研究。最终,这些结果可以为 PSP 平板质量保证提供建议。

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