Ribes Àngela, Sánchez-Cabezas Santiago, Hernández-Montoto Andy, Villaescusa Luis A, Aznar Elena, Martínez-Máñez Ramón, Marcos M Dolores, López-Tendero M José, Pradas Sarai, Cuenca-Bustos Alejandro
Instituto Interuniversitario de Investigación de Reconocimiento Molecular y Desarrollo Tecnológico (IDM) Universitat de València-Universitat Politècnica de València, Camino de Vera s/n, 46022 Valencia, Spain.
CIBER de Bioingeniería Biomateriales y Nanomedicina (CIBER-BBN), 46022 Valencia, Spain.
Materials (Basel). 2020 Feb 1;13(3):649. doi: 10.3390/ma13030649.
The addition of light ceramic particles to bulk technological materials as reinforcement to improve their mechanical properties has attracted increasing interest in the last years. The metal matrix composites obtained using nanoparticles have been reported to exhibit an improvement of their properties due to the decrease in the size of the ceramic additives to the nanoscale. Additionally, important effects such as the dispersion of the nanoparticles, wettability, and low reactivity can be controlled by the modification of the nanoparticles' surface. In this work, we present the preparation of core-shell MO@SiC nanoparticles with different shell compositions. The accurate and reproducible preparation is developed both at the lab and pilot scale. The synthesis of these core-shell nanoparticles and their scale-up production are fundamental steps for their industrial use as additives in metal matrix composites and alloys. Powder X-ray diffraction and energy dispersive X-ray (EDX) coupled with scanning transmission electron microscopy (STEM) are used to corroborate the formation of the core-shell systems, whereas line scan-EDX analysis allows measuring the average shell thickness.
在块状工业材料中添加轻质陶瓷颗粒作为增强剂以改善其机械性能,在过去几年中引起了越来越多的关注。据报道,使用纳米颗粒获得的金属基复合材料由于陶瓷添加剂尺寸减小到纳米级而使其性能得到改善。此外,诸如纳米颗粒的分散、润湿性和低反应性等重要影响可以通过修饰纳米颗粒表面来控制。在这项工作中,我们展示了具有不同壳层组成的核壳MO@SiC纳米颗粒的制备。在实验室和中试规模上都开发了精确且可重复的制备方法。这些核壳纳米颗粒的合成及其放大生产是它们作为金属基复合材料和合金中的添加剂进行工业应用的基本步骤。粉末X射线衍射和能量色散X射线(EDX)与扫描透射电子显微镜(STEM)相结合,用于证实核壳体系的形成,而线扫描EDX分析则允许测量平均壳层厚度。