Abegunde Olayinka Oluwatosin, Akinlabi Esther Titilayo, Oladijo Philip Oluseyi
Department of Mechanical Engineering Science, University of Johannesburg, Johannesburg, South Africa.
Department of Chemical, Materials and Metallurgy Engineering, Botswana Institute of Science and Technology, Palapye, Botswana.
Data Brief. 2020 Jan 25;29:105205. doi: 10.1016/j.dib.2020.105205. eCollection 2020 Apr.
The datasets in this article are supplementary to the corresponding research article [1, 2]. The planar morphology and topography of TiC thin films coated on commercially pure Titanium (CpTi) grown by RF magnetron sputtering were investigated using Field emission scanning electron microscope (FESEM) and Atomic force microscope (AFM). The mechanical properties such as Hardness and Young Modulus of the thin film coating was studied using Nanohardness. Furthermore, grazing incidence X-ray diffractometer (GIXRD) and Raman spectroscopy were used to analyse the structural and composition of the TiC thin film coating.
本文中的数据集是对相应研究论文[1, 2]的补充。使用场发射扫描电子显微镜（FESEM）和原子力显微镜（AFM）研究了通过射频磁控溅射在商业纯钛（CpTi）上生长的TiC薄膜的平面形态和形貌。使用纳米硬度研究了薄膜涂层的硬度和杨氏模量等力学性能。此外，使用掠入射X射线衍射仪（GIXRD）和拉曼光谱分析了TiC薄膜涂层的结构和成分。
