Shi Yafang, Wang Longlong, Qiao Xiaofen, Li Shuai, Liu Yi, Li Xiaoli, Zhao Xiaohui
National-Local Joint Engineering Laboratory of New Energy Photoelectric Devices, College of Physics Science & Technology, Hebei University, Baoding, 071002, People's Republic of China.
State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, People's Republic of China.
Nanoscale Res Lett. 2020 Feb 17;15(1):43. doi: 10.1186/s11671-020-3280-8.
MoS and ReS are typical transition metal chalcogenides with many excellent electrical and optical properties. Due to different lattice symmetries, ReS offers one more dimension than MoS to tune its physical properties. In this paper, we studied the polarized reflection spectra in single-layer MoS and ReS. The explicit difference identifies strong angle-dependent properties in single-layer ReS distinct from single-layer MoS. The results of samples on both SiO/Si substrate and quartz substrate show single-layer ReS is in-plane anisotropic and the change period of reflection intensity is estimated with the polarization angles.
二硫化钼（MoS）和二硫化铼（ReS）是典型的过渡金属硫族化合物，具有许多优异的电学和光学性质。由于晶格对称性不同，二硫化铼比二硫化钼多一个维度来调节其物理性质。在本文中，我们研究了单层二硫化钼和二硫化铼的偏振反射光谱。明显的差异表明单层二硫化铼具有与单层二硫化钼不同的强烈角度依赖性特性。在二氧化硅/硅衬底和石英衬底上的样品结果表明，单层二硫化铼是面内各向异性的，并且用偏振角估计了反射强度的变化周期。
