Focused ion beam for improved spatially-resolved mass spectrometry and analysis of radioactive materials for uranium isotopic analysis.

The ability to acquire high-quality spatially-resolved mass spectrometry data is sought in many fields of study, but it often comes with high cost of instrumentation and a high level of expertise required. In addition, techniques highly regarded for isotopic analysis applications such as thermal ionization mass spectrometry (TIMS) do not have the ability to acquire spatially-resolved data. Another drawback is that for radioactive materials, which are often of interest for isotopic analysis in geochemistry and nuclear forensics applications, high-end instruments often have restrictions on radioactivity and non-dispersibility requirements. We have applied the use of a traditional microanalysis tool, the focused ion beam/scanning electron microscope (FIB/SEM), for preparation of radioactive materials either for direct analysis by spatially-resolved instruments such as secondary ion mass spectrometry (SIMS) and laser ablation inductively-coupled mass spectrometry (LA-ICP-MS), or similarly to provide some level of spatial resolution to techniques that do not inherently have that ability such as TIMS or quadrupole inductively coupled plasma mass spectrometry (Q-ICP-MS). We applied this preparation technique to various uranium compounds, which was especially useful for reducing sample sizes and ensuring non-dispersibility to allow for entry into non-radiological or ultra-trace facilities. Our results show how this site-specific preparation can provide spatial context for nominally bulk techniques such as TIMS and Q-ICP-MS. In addition, the analysis of samples extracted from a uranium dioxide fuel pellet via all methods, but especially NanoSIMS and LA-ICP-MS, showed enrichment heterogeneities that are important for nuclear forensics and are of interest for fuel performance.