Rehabilitation Center, 1000 Veteran Ave., Los Angeles, CA, USA.
Clinical Affairs, Cochlear Ltd, Macquarie University, Sydney, Australia.
Cochlear Implants Int. 2020 Jul;21(4):206-219. doi: 10.1080/14670100.2020.1730066. Epub 2020 Feb 20.
The aim of this discussion paper and literature review was to estimate the incidence of a variety of complications associated with the surgical placement of cochlear implant (CI) electrode arrays and to discuss the implications and management of sub-optimal electrode placement. A review of the peer-reviewed literature suggests that the incidence of incomplete electrode insertion and kinking is more prevalent in straight arrays and not more than about 2% in CI recipients with normal cochlear anatomy/patency. Incidence of tip fold-over is greater with perimodiolar arrays but also occurs with straight arrays and is typically less than 5%. Conversely, electrode migration is more common with straight arrays, and high rates (up to 46%) have been reported in some studies. Scalar translocations have also been reported for both perimodiolar and straight arrays. Higher rates have been reported for stylet-based perimodiolar electrodes inserted via cochleostomy (up to 56%), but with much lower rates (<10%) with both sheath-based perimodiolar arrays and lateral wall arrays. Electrode positioning complications represent a significant proportion of perioperative CI complications and compromise the level of benefit from the device. Careful surgical planning and appropriate pre- and intraoperative imaging can reduce the likelihood and impact of electrode positioning complications. There is also evidence that newer array designs are less prone to certain complications, particularly scalar translocation. It is important that implanting surgeons are aware of the impact of sub-optimal electrode placement and the steps that can be taken to avoid, identify and manage such complications.
本讨论文件和文献回顾的目的是估计与耳蜗植入 (CI) 电极阵列的外科放置相关的各种并发症的发生率,并讨论次优电极放置的影响和管理。对同行评议文献的回顾表明,在直形阵列中,不完全电极插入和扭曲的发生率更为常见,而在具有正常耳蜗解剖/通畅性的 CI 接受者中,其发生率不超过约 2%。在螺旋电极阵列中,尖端折叠的发生率更高,但也会发生在直形阵列中,通常不到 5%。相反,直形阵列中电极迁移更为常见,一些研究报告的发生率高达 46%。螺旋电极和直形电极都有报道发生电极迁移。基于导丝的螺旋电极通过耳蜗造口术插入的报告发生率更高(高达 56%),但基于鞘的螺旋电极和侧壁电极的报告发生率要低得多(<10%)。电极定位并发症是围手术期 CI 并发症的重要组成部分,会影响设备的受益程度。仔细的手术计划和适当的术前和术中成像可以降低电极定位并发症的可能性和影响。还有证据表明,新的阵列设计不太容易发生某些并发症,特别是电极迁移。植入外科医生需要了解次优电极放置的影响,以及可以采取哪些步骤来避免、识别和管理此类并发症。