Department of Food, Environmental, and Nutritional Sciences (DeFENS), Università degli Studi di Milano, via G. Celoria 2, 20133 Milan, Italy.
GEM ICT Research & Development, Via Robert Schuman n.14, 70126 Bari, Italy.
Sensors (Basel). 2020 Feb 19;20(4):1147. doi: 10.3390/s20041147.
The milling industry envisions solutions to become fully compatible with the industry 4.0 technology where sensors interconnect devices, machines and processes. In this contest, the work presents an integrated solution merging a deeper understanding and control of the process due to real-time data collection by MicroNIR sensors (VIAVI, Santa Rosa, CA)-directly from the manufacturing process-and data analysis by Chemometrics. To the aim the sensors were positioned at wheat cleaning and at the flour blends phase and near infrared spectra (951-1608 nm) were collected online. Regression models were developed merging the spectra information with the results obtained by reference analyses, i.e., chemical composition and rheological properties of dough by Farinograph (Brabender GmbH and Co., Duisburg, Germany), Alveograph (Chopin, NG Villeneuve-la-Garenne Cedex, France) and Extensograph.(Brabender GmbH and Co., Duisburg, Germany) The model performance was tested by an external dataset obtaining, for most of the parameters, R higher than 0.80 and Root Mean Squares Errors in prediction lower than two-fold the value of the reference method errors. The real-time implementation resulted in optimal (100% of samples) or really good (99.9%-80% of samples) prediction ability. The proposed work succeeded in the implementation of a process analytical approach with Industrial Internet of Things near infrared (IIoT NIR) devices for the prediction of relevant grain and flour characteristics of common wheat at the industrial level.
磨粉行业设想解决方案,使其与工业 4.0 技术完全兼容,在该技术中,传感器将设备、机器和流程相互连接。在这场竞争中,这项工作提出了一个集成解决方案,通过微近红外传感器(VIAVI,加利福尼亚州圣罗莎)实时收集数据,对过程进行更深入的了解和控制,从而实现了融合。-直接从制造过程中-并通过化学计量学进行数据分析。为此,将传感器定位在小麦清理和面粉混合阶段,并在线收集近红外光谱(951-1608nm)。通过将光谱信息与参考分析结果(即由德国布拉本德公司的粉质仪获得的面团化学成分和流变性能,法国肖潘公司的拉伸仪)相结合,开发了回归模型。(德国布拉本德公司)。通过外部数据集测试了模型性能,对于大多数参数,R 值高于 0.80,预测误差的均方根误差低于参考方法误差的两倍。实时实施结果表明,预测能力最佳(100%的样品)或非常好(99.9%-80%的样品)。这项工作成功地在工业物联网近红外(IIoT NIR)设备的过程分析方法的实施方面取得了成功,可用于预测普通小麦在工业水平上的相关谷物和面粉特性。