Sartori E, Candeloro V, Serianni G
Consorzio RFX, Corso Stati Uniti 4, 35127 Padova (PD), Italy.
Università degli Studi di Padova, Via 8 Febbraio 2, I-35122 Padova (PD), Italy.
Rev Sci Instrum. 2020 Feb 1;91(2):023504. doi: 10.1063/1.5128669.
Movable electrical probes were used to diagnose the beam flux profile and potential of ion beams since the early 1960s. Experimental measurements of beam plasmas can provide essential data related to the space charge neutralization, but the current-voltage characteristics obtained from such electrical probes are dominated by beam ion impact and ion-induced secondary emission. In this work, we present an analysis of the Langmuir characteristics obtained in a negative ion beam. We identify and discuss separately the contributions to the collected current given by secondary plasma ions and electrons, stripped electrons, beam ions, and ion-induced secondary electron emission. We present the beam plasma parameters obtained at different beam energies in NIO1.
自20世纪60年代初以来，可移动的电探针被用于诊断离子束的束流通量分布和电位。束流等离子体的实验测量可以提供与空间电荷中和相关的重要数据，但是从这种电探针获得的电流-电压特性主要由束流离子撞击和离子诱导二次发射主导。在这项工作中，我们对负离子束中获得的朗缪尔特性进行了分析。我们分别识别并讨论了二次等离子体离子和电子、剥离电子、束流离子以及离子诱导二次电子发射对收集到的电流的贡献。我们展示了在NIO1中不同束流能量下获得的束流等离子体参数。
