Levine Andrew M, Bu Guanhong, Biswas Sankarsan, Tsai Esther H R, Braunschweig Adam B, Nannenga Brent L
Nanoscience Initiative, Advanced Science Research Center, Graduate Center, City University of New York, 85 St. Nicholas Terrace, New York, NY 10031, USA.
Chemical Engineering, School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ 85287, USA.
Chem Commun (Camb). 2020 Apr 14;56(30):4204-4207. doi: 10.1039/d0cc00119h.
We use microcrystal electron diffraction (MicroED) to determine structures of three organic semiconductors, and show that these structures can be used along with grazing-incidence wide-angle X-ray scattering (GIWAXS) to understand crystal packing and orientation in thin films. Together these complimentary techniques provide unique structural insights into organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state order.
我们使用微晶电子衍射（MicroED）来确定三种有机半导体的结构，并表明这些结构可与掠入射广角X射线散射（GIWAXS）一起用于了解薄膜中的晶体堆积和取向。这些互补技术共同为有机半导体薄膜提供了独特的结构见解，这类材料的器件性能和电子行为敏感地依赖于固态有序性。
