Koester Charles J
J Res Natl Bur Stand A Phys Chem. 1960 May-Jun;64A(3):191-200. doi: 10.6028/jres.064A.020. Epub 1960 Jun 1.
A method is demonstrated for utilizing in Fabry-Perot interferometry the data on reflection phase shift dispersion obtained from fringes of equal chromatic order. Unknown wavelengths can be calculated from the Fabry-Perot patterns obtained with a large etalon spacing, even without prior knowledge of the phase shift of the reflecting surfaces. When the theoretical phase shift as a function of wavelength is known approximately, then the correct orders of interference can be determined for both the Fabry-Perot fringes and fringes of equal chromatic order. From the wavelengths of the latter the phase shift dispersion can be measured to an accuracy of about 10 A. The method is especially useful for reflectors with large dispersion of phase shift, such as multilayers. Results in the visible spectrum are reported for aluminum films and a pair of dielectric 15-layer broadband reflectors.
展示了一种在法布里 - 珀罗干涉测量法中利用从等色序条纹获得的反射相移色散数据的方法。即使在不知道反射面的相移的情况下，也可以根据用大间距标准具获得的法布里 - 珀罗图案计算未知波长。当理论相移作为波长的函数大致已知时，就可以确定法布里 - 珀罗条纹和等色序条纹的正确干涉级次。根据后者的波长，可以将相移色散测量到约10埃的精度。该方法对于具有大相移色散的反射器（如多层膜）特别有用。报告了铝膜和一对15层介质宽带反射器在可见光谱中的结果。
