Zdora M-C, Zanette I, Walker T, Phillips N W, Smith R, Deyhle H, Ahmed S, Thibault P
Appl Opt. 2020 Mar 10;59(8):2270-2275. doi: 10.1364/AO.384531.
X-ray phase-contrast techniques are powerful methods for discerning features with similar densities, which are normally indistinguishable with conventional absorption contrast. While these techniques are well-established tools at large-scale synchrotron facilities, efforts have increasingly focused on implementations at laboratory sources for widespread use. X-ray speckle-based imaging is one of the phase-contrast techniques with high potential for translation to conventional x-ray systems. It yields phase-contrast, transmission, and dark-field images with high sensitivity using a relatively simple and cost-effective setup tolerant to divergent and polychromatic beams. Recently, we have introduced the unified modulated pattern analysis (UMPA) [Phys. Rev. Lett.118, 203903 (2017)PRLTAO0031-900710.1103/PhysRevLett.118.203903], which further simplifies the translation of x-ray speckle-based imaging to low-brilliance sources. Here, we present the proof-of-principle implementation of UMPA speckle-based imaging at a microfocus liquid-metal-jet x-ray laboratory source.
X射线相衬技术是辨别密度相似特征的强大方法，而这些特征通常用传统吸收对比法无法区分。虽然这些技术在大型同步加速器设施中是成熟的工具，但人们越来越多地致力于在实验室光源上实现，以便广泛应用。基于X射线散斑的成像是具有高潜力转化为传统X射线系统的相衬技术之一。它使用相对简单且经济高效的装置，对发散和多色光束具有耐受性，能以高灵敏度产生相衬、透射和暗场图像。最近，我们引入了统一调制图案分析（UMPA）[《物理评论快报》118, 203903 (2017) PRLTAO0031 - 900710.1103/PhysRevLett.118.203903]，这进一步简化了基于X射线散斑成像向低亮度光源的转化。在此，我们展示了在微聚焦液态金属喷射X射线实验室光源上基于UMPA散斑成像的原理验证实现。
