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采用无掩膜紫外光刻技术制作的厘米级超临界透镜阵列。

Supercritical lens array in a centimeter scale patterned with maskless UV lithography.

作者信息

Zhu Xufeng, Fang Wei, Lei Jian, Li Zhangyin, Xie Fei, Cao Yaoyu, Zhang Yaping, Qin Fei, Li Xiangping

出版信息

Opt Lett. 2020 Apr 1;45(7):1798-1801. doi: 10.1364/OL.389702.

Abstract

Microlens arrays (MLAs) are widely used in optical imaging, dense wavelength division multiplexing, optical switching, and microstructure patterning, etc. However, the light modulation capability for both the conventional refractive-type MLA and planar diffractive-type MLA is still staying at the diffraction-limited scale. Here we propose and experimentally demonstrate a high numerical aperture (NA) supercritical lens (SCL) array which could achieve a sub-diffraction-limited focal spot lattice in the far field. The intensity distribution for all the focal spots has good uniformity with the lateral size around ${0.45}\lambda {\rm /NA}$0.45λ/NA (0.75X Airy unit). The elementary unit in the SCL array composes a series of concentric belts with a feature size in micrometer scale. By utilizing an ultrafast ultraviolet lithography technique, a centimeter scale SCL array could be successfully patterned within 10 mins. Our results may provide possibilities for the applications in optical nanofabrication, super-resolution imaging, and ultrafine optical manipulation.

摘要

微透镜阵列(MLA)广泛应用于光学成像、密集波分复用、光开关和微结构图案化等领域。然而,传统折射型MLA和平面衍射型MLA的光调制能力仍停留在衍射极限尺度。在此,我们提出并通过实验证明了一种高数值孔径(NA)超临界透镜(SCL)阵列,它能够在远场实现亚衍射极限焦斑晶格。所有焦斑的强度分布具有良好的均匀性,横向尺寸约为${0.45}\lambda {\rm /NA}$(0.75倍艾里单位)。SCL阵列中的基本单元由一系列特征尺寸为微米级的同心带组成。通过利用超快紫外光刻技术,可在10分钟内成功制备出厘米级的SCL阵列。我们的结果可能为光学纳米制造、超分辨率成像和超精细光学操纵等应用提供可能性。

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