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背散射和透射菊池衍射花样中角度的手动测量。

Manual measurement of angles in backscattered and transmission Kikuchi diffraction patterns.

作者信息

Nolze Gert, Tokarski Tomasz, Cios Grzegorz, Winkelmann Aimo

机构信息

Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.

Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, Mickiewicza 30, 30-059 Krakow, Poland.

出版信息

J Appl Crystallogr. 2020 Mar 25;53(Pt 2):435-443. doi: 10.1107/S1600576720000692. eCollection 2020 Apr 1.

DOI:10.1107/S1600576720000692
PMID:32280320
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7133066/
Abstract

A historical tool for crystallographic analysis is provided by the Hilton net, which can be used for manually surveying the crystal lattice as it is manifested by the Kikuchi bands in a gnomonic projection. For a quantitative analysis using the Hilton net, the projection centre as the relative position of the signal source with respect to the detector plane needs to be known. Interplanar angles are accessible with a precision and accuracy which is estimated to be ≤0.3°. Angles between any directions, zone axes, are directly readable. Finally, for the rare case of an unknown projection-centre position, its determination is demonstrated by adapting an old approach developed for photogrammetric applications. It requires the indexing of four zone axes [] in a backscattered Kikuchi diffraction pattern of a known phase collected under comparable geometric conditions.

摘要

希尔顿网提供了一种用于晶体学分析的历史工具,它可用于手动测量晶格,晶格由极射赤面投影中的菊池带来体现。对于使用希尔顿网的定量分析,需要知道作为信号源相对于探测器平面的相对位置的投影中心。晶面间角度的精度和准确度估计≤0.3°。任何方向(晶带轴)之间的角度都可直接读取。最后,对于投影中心位置未知这种罕见情况,通过采用一种为摄影测量应用开发的旧方法来确定其位置。这需要在可比几何条件下收集的已知相的背散射菊池衍射图案中对四个晶带轴进行指标化。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/5db82065f87f/j-53-00435-fig5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/08b3ccee83ec/j-53-00435-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/9308e51c3204/j-53-00435-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/08081d6f2c9d/j-53-00435-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/6d49429e33db/j-53-00435-fig4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/5db82065f87f/j-53-00435-fig5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/08b3ccee83ec/j-53-00435-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/9308e51c3204/j-53-00435-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/08081d6f2c9d/j-53-00435-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/6d49429e33db/j-53-00435-fig4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8a8f/7133066/5db82065f87f/j-53-00435-fig5.jpg

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引用本文的文献

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本文引用的文献

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Direct Atom Imaging by Chemical-Sensitive Holography.化学敏感全息术的直接原子成像。
Nano Lett. 2016 May 11;16(5):3195-201. doi: 10.1021/acs.nanolett.6b00524. Epub 2016 Apr 21.
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Pattern center determination in electron backscatter diffraction microscopy.电子背散射衍射显微镜中的花样中心确定。
Microsc Microanal. 2011 Jun;17(3):330-40. doi: 10.1017/S1431927611000389.
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Towards high accuracy calibration of electron backscatter diffraction systems.朝向电子背散射衍射系统的高精度校准。
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