Szmacinski Henryk, Lakowicz Joseph R
Department of Molecular Biology and Biochemistry, Center for Fluorescence Spectroscopy, University of Maryland School of Medicine, 725 West Lombard Street, Baltimore, Maryland 21201.
Appl Spectrosc. 1999 Dec;53(12):1490-1495. doi: 10.1366/0003702991946109.
We describe a method to correct for background fluorescence and to measure the intensity of long-lifetime probes using phase-modulation fluorometry. The theoretically predicted and simulated data were supported by two experiments. The fractional contribution of background fluorescence in the sample was determined by measurement of phase angle and/or modulation at single modulation frequency. In certain experimental situations, where the mean decay times of the background and the long lifetime probe are widely separated, determination of background signals in the sample does not require a blank sample or information about the nature of intensity decay of the background. Hence, phase-modulation fluorometry can be used to directly determine the intensity of the long-lifetime probe in the presence of an unknown short-lifetime background. We also discuss the effects of ambient light (indefinitely long lifetime) and scattered excitation light (zero lifetime) on phase-modulation measurements.
我们描述了一种使用相位调制荧光法校正背景荧光并测量长寿命探针强度的方法。理论预测和模拟数据得到了两个实验的支持。通过在单调制频率下测量相角和/或调制来确定样品中背景荧光的分数贡献。在某些实验情况下,背景和长寿命探针的平均衰减时间相差很大,确定样品中的背景信号不需要空白样品或关于背景强度衰减性质的信息。因此,相位调制荧光法可用于在存在未知短寿命背景的情况下直接确定长寿命探针的强度。我们还讨论了环境光(无限长寿命)和散射激发光(零寿命)对相位调制测量的影响。