Tan Ya, Duan Ling, Yang Kai, Liu Qian, Wang Jing, Dong Zhe, Li Zhi, He Yiwen, Yan Yousheng, Lin Li
Department of Obstetrics and Gynecology, Peking University International Hospital, Beijing, China.
Mianyang Maternity and Child Health Care Hospital, Sichuan, China.
J Clin Lab Anal. 2020 Aug;34(8):e23326. doi: 10.1002/jcla.23326. Epub 2020 Apr 14.
Zhu-Tokita-Takenouchi-Kim syndrome is a severe multisystem developmental disorder characterized by intellectual disability, developmental delay, malformations of the cerebral cortex, epilepsy, vision problems, musculoskeletal abnormalities, and congenital malformations. This syndrome is caused by heterozygous pathogenic variants in the SON gene at chromosome 21q22.1.
The aim of this study was to investigate the pathogenesis of a 4-year-old Chinese child who displayed severe intellectual disability, delayed psychomotor development, and facial dysmorphism.
A sequential detection including chromosome karyotyping, chromosome microarray analysis (CMA), and whole-exome sequencing (WES) was performed on this child. The familial verification of WES result was conducted by Sanger sequencing.
A de novo frameshift variant SON: c.5230delC (p.Arg1744ValfsTer29) was identified in the proband. The identical variant was not found in his family members. The frequencies of this variant in gnomAD/gnomAD_EAS databases were both none.
This study substantiates that SON: c.5230delC (p.Arg1744ValfsTer29) is a pathogenic variant of Zhu-Tokita-Takenouchi-Kim syndrome and it is the first time to report Zhu-Tokita-Takenouchi-Kim syndrome in China.
朱-户田-竹野内-金综合征是一种严重的多系统发育障碍,其特征为智力残疾、发育迟缓、大脑皮质畸形、癫痫、视力问题、肌肉骨骼异常和先天性畸形。该综合征由21号染色体q22.1区域的SON基因杂合致病变异引起。
本研究旨在探究一名4岁中国儿童出现严重智力残疾、精神运动发育迟缓及面部畸形的发病机制。
对该患儿进行了包括染色体核型分析、染色体微阵列分析(CMA)和全外显子组测序(WES)的系列检测。通过Sanger测序对WES结果进行家系验证。
在先证者中鉴定出一个新发的移码变异SON:c.5230delC(p.Arg1744ValfsTer29)。其家庭成员中未发现相同变异。该变异在gnomAD/gnomAD_EAS数据库中的频率均为零。
本研究证实SON:c.5230delC(p.Arg1744ValfsTer29)是朱-户田-竹野内-金综合征的致病变异,且这是中国首次报道朱-户田-竹野内-金综合征。