Ostermayer Christian Lang, Correia Alexandre L
Institute of Physics, University of Sao Paulo, Rua do Matao 1371, 05508-090 Sao Paulo, SP, Brazil.
Heliyon. 2020 Apr 24;6(4):e03762. doi: 10.1016/j.heliyon.2020.e03762. eCollection 2020 Apr.
Hg-Cd-Te (MCT) cameras can be used to analyze the thermal emission or the infrared reflective response of physical systems. However, measurements performed with this instrument need to be corrected for the thermal emission from the environment surrounding the camera. In this work we analyzed this effect under conditions typically met in field applications, when environmental temperature variations are common. The dark current signal on a Xeva MCT 320 CL TE4 camera was studied as a function of ambient temperature and the integration time used for image acquisition. The MCT sensor at the focal plane was kept at a constant nominal temperature of 210 K by a thermoelectric cooler unit throughout the experiment. Integration times for data acquisition varied between 2.0 to 12.0 ms. The camera body temperature was monitored within ±0.2°C, ranging from about 17.0°C to 27.0°C. The camera unit was allowed to reach thermal stabilization in a controlled-temperature lab before each measurement session. Both the integration time, and temperature range intervals were chosen to represent typical field deployment conditions. The average dark current signal showed a clear linear dependence with integration time, for a constant environmental temperature setting. The slope of this linear relation increased with the ambient temperature, whereas the intercept was insensitive to temperature changes. The standard deviation of the dark current signal was a function of integration time, but independent of the ambient temperature setting. These results allowed modeling the dark current signal as a function of the integration time and the camera body temperature. To minimize the dark current for a given integration time setting, measurements should be performed under the coldest possible conditions, in opposition to manufacturer recommendations. As a direct consequence of these results, the useful dynamic range for science applications with this MCT camera is reduced with increasing integration times and ambient temperatures. For instance, when acquiring images with 5 ms integration time, at 22°C ambient temperature, the resulting dark current signal reduces the maximum useful dynamic range in about 20%. The results shown here can be promptly adapted to other applications with MCT cameras, especially in situations with a non-controlled thermal environment, or when analyzing the reflective properties of cold targets.
汞镉碲(MCT)相机可用于分析物理系统的热发射或红外反射响应。然而,使用该仪器进行的测量需要针对相机周围环境的热发射进行校正。在这项工作中,我们分析了在现场应用中常见的环境温度变化条件下的这种影响。研究了Xeva MCT 320 CL TE4相机上的暗电流信号与环境温度以及用于图像采集的积分时间的函数关系。在整个实验过程中,焦平面上的MCT传感器通过热电冷却器单元保持在210 K的恒定标称温度。数据采集的积分时间在2.0至12.0毫秒之间变化。相机机身温度在±0.2°C范围内进行监测,范围约为17.0°C至27.0°C。在每次测量之前,相机单元在恒温实验室中达到热稳定状态。积分时间和温度范围间隔均选择为代表典型的现场部署条件。对于恒定的环境温度设置,平均暗电流信号与积分时间呈现明显的线性关系。这种线性关系的斜率随环境温度增加而增大,而截距对温度变化不敏感。暗电流信号的标准偏差是积分时间的函数,但与环境温度设置无关。这些结果使得能够将暗电流信号建模为积分时间和相机机身温度的函数。为了在给定的积分时间设置下最小化暗电流,应在尽可能冷的条件下进行测量,这与制造商的建议相反。这些结果的直接后果是,随着积分时间和环境温度的增加,该MCT相机用于科学应用的有用动态范围会减小。例如,当在22°C的环境温度下以5毫秒的积分时间采集图像时,产生的暗电流信号会使最大有用动态范围降低约20%。此处所示结果可迅速应用于其他使用MCT相机的应用中,特别是在热环境不受控制的情况下,或分析冷目标的反射特性时。