Menteş T O, Genuzio F, Schánilec V, Sadílek J, Rougemaille N, Locatelli A
Sincrotrone Trieste S.C.p.A., Basovizza-Trieste 34149, Italy.
Sincrotrone Trieste S.C.p.A., Basovizza-Trieste 34149, Italy.
Ultramicroscopy. 2020 Sep;216:113035. doi: 10.1016/j.ultramic.2020.113035. Epub 2020 May 25.
X-ray photoemission electron microscopy, one of the most successful imaging tools at synchrotrons, is known to have limitations related to the application of external fields and to the short electron mean free path. In order to overcome such issues, we adapt an existing XPEEM instrument to simultaneously perform coherent x-ray scattering measurements in reflectivity mode, thus adding a complementary method to XPEEM. Photon-in photon-out x-ray scattering provides the sensitivity to buried interfaces as well as the possibility to work under external fields, which is challenging when using charged particles for imaging. XPEEM, in turn, greatly alleviates the difficulties associated with the reconstruction methods used in coherent diffraction imaging. The combination of the two methods is demonstrated for an artifical spin-ice lattice showing both chemical and magnetic contrast.
X射线光电子能谱显微镜是同步加速器中最成功的成像工具之一，已知它在外部场的应用和短电子平均自由程方面存在局限性。为了克服这些问题，我们对现有的X射线光电子能谱显微镜仪器进行了改造，以便在反射率模式下同时进行相干X射线散射测量，从而为X射线光电子能谱显微镜增加一种互补方法。光子入-光子出X射线散射提供了对埋藏界面的灵敏度以及在外部场下工作的可能性，而使用带电粒子进行成像时这具有挑战性。反过来，X射线光电子能谱显微镜极大地减轻了与相干衍射成像中使用的重建方法相关的困难。这两种方法的结合在显示化学和磁对比度的人工自旋冰晶格上得到了证明。
