Rupp Daniela, Flückiger Leonie, Adolph Marcus, Colombo Alessandro, Gorkhover Tais, Harmand Marion, Krikunova Maria, Müller Jan Philippe, Oelze Tim, Ovcharenko Yevheniy, Richter Maria, Sauppe Mario, Schorb Sebastian, Treusch Rolf, Wolter David, Bostedt Christoph, Möller Thomas
IOAP, Technische Universität Berlin, 10623 Berlin, Germany.
LFKP, ETH Zürich, 8093 Zürich, Switzerland.
Struct Dyn. 2020 Jun 18;7(3):034303. doi: 10.1063/4.0000006. eCollection 2020 May.
We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate the influence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in the wavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties from areas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tens of nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural timescale.
我们记录了用强极紫外脉冲照射单个氙团簇时的衍射图样，以研究光致电子变化对散射响应的影响。在中性和离子态氙的不同4d内壳层共振波长范围内，用短波长脉冲照射这些团簇，导致团簇中电荷态较低或较高区域的光学性质明显不同。数据显示，在原本均匀的样品中出现了一种空间扩展达数十纳米的瞬态结构。模拟表明，电离和纳米等离子体的形成导致团簇中形成一个折射率发生强烈变化的光致外壳。所提出的共振散射方法能够在其自然时间尺度上对超快电子动力学进行成像。
