Hou Pengfei, Wang Xinhao, Liu Yunxia, Chen Yun, Dong Shijian, Guo Hongxia, Wang Jinbin, Zhong Xiangli, Ouyang Xiaoping
Key Laboratory of Low-dimensional Materials and Application Technology, School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China.
Phys Chem Chem Phys. 2020 Jul 22;22(28):15799-15804. doi: 10.1039/d0cp02375b.
The discovery of layered two-dimensional (2D) ferroelectric materials has promoted the development of miniaturized and highly integrated ferroelectric electronics. The 2D ferroelectric materials can be applied in a radiation environment, in which the effect of radiation on these materials should be considered. However, the effects of radiation on 2D ferroelectric materials may be entirely different from those on traditional ferroelectric materials. Ionization effect-induced domain switching can be recovered by applying an external electric field, whereas the displacement effect initiated by radiation particles produces crystal structure damage. The displacement damage that is extremely difficult to recover may have a negative impact on the application of 2D ferroelectric materials in a radiation environment. In this study, the effect of displacement induced by neutron irradiation on the promising α-In2Se3 nanoflakes was investigated. Neutron irradiation (1 MeV) with a fluence of 1014 cm-2 was used for avoiding ionization effects in a certain range. Although the topography of α-In2Se3 does not change underneutron irradiation, vacancies have been proved to be induced by neutron irradiation; furthermore, it has been identified that the vacancies mostly originate from the loss of In atoms. The out-of-plane (OOP) and in-plane (IP) domain structures of the α-In2Se3 nanoflakes with a few layers only slighlty change. In addition, the polarization of the irradiated nanoflakes could still be reversed. All these findings show that although the vacancies may influence the band structure and polarizaiton values of α-In2Se3, the ferroelectric performance may have a strong resistance to neutron irradiation. Therefore, our investigation implies that α-In2Se3 is an excellent 2D ferroelectric material for application in radiation-resistant electronic devices in the future.
层状二维(2D)铁电材料的发现推动了小型化和高度集成铁电电子学的发展。二维铁电材料可应用于辐射环境,在这种环境中应考虑辐射对这些材料的影响。然而,辐射对二维铁电材料的影响可能与对传统铁电材料的影响完全不同。电离效应引起的畴切换可通过施加外部电场恢复,而辐射粒子引发的位移效应会导致晶体结构损伤。极难恢复的位移损伤可能会对二维铁电材料在辐射环境中的应用产生负面影响。在本研究中,研究了中子辐照引起的位移对有前景的α-In2Se3纳米片的影响。使用通量为1014 cm-2的1 MeV中子辐照,以在一定范围内避免电离效应。尽管α-In2Se3的形貌在中子辐照下不变,但已证明中子辐照会诱导空位;此外,已确定空位主要源于In原子的损失。仅几层的α-In2Se3纳米片的面外(OOP)和面内(IP)畴结构仅略有变化。此外,辐照纳米片的极化仍可反转。所有这些发现表明,尽管空位可能会影响α-In2Se3的能带结构和极化值,但铁电性能可能对中子辐照具有较强的抗性。因此,我们的研究表明α-In2Se3是未来应用于抗辐射电子器件的优异二维铁电材料。