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γ射线诱导的畴演化对α-InSe纳米薄片的总剂量效应。

The total dose effect of γ-ray induced domain evolution on α-InSe nanoflakes.

作者信息

Hou Pengfei, Chen Yun, Wang Xinhao, Lv Yang, Guo Hongxia, Wang Jinbin, Zhong Xiangli, Ouyang Xiaoping

机构信息

Key Laboratory of Low-dimensional Materials and Application Technology, School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China.

出版信息

Phys Chem Chem Phys. 2020 Apr 8;22(14):7160-7164. doi: 10.1039/d0cp00512f.

Abstract

Two-dimensional ferroelectric materials can maintain stable polarization with atomic layer thickness, and they have a wide range of technological applications in transistors, resistive memories, energy collectors and other multi-functional sensors for highly integrated flexible electronics. Domain evolution should be considered when 2d ferroelectric material-based devices are applied in a radiation environment, which may induce radiation damage and performance degradation. In this work, we investigate the domain evolution and photodetection performance degradation of α-In2Se3 nanoflakes induced by the total dose effect of 60Co γ-rays. The phonon modes change with an increase in total dose, while the domain structure changes in α-In2Se3 based transistors. Domain evolution may be one of the main reasons for the photoresponsivity degradation of these transistors. This investigation can provide a solid base for future research, and immediate applications in 2d ferroelectric material-based devices can be contemplated.

摘要

二维铁电材料能够在原子层厚度下保持稳定的极化,并且在用于高度集成柔性电子器件的晶体管、电阻式存储器、能量收集器及其他多功能传感器方面具有广泛的技术应用。当基于二维铁电材料的器件应用于辐射环境时,应考虑畴演化,这可能会导致辐射损伤和性能退化。在这项工作中,我们研究了由60Coγ射线的总剂量效应引起的α-In2Se3纳米片的畴演化和光探测性能退化。随着总剂量的增加,声子模式发生变化,而基于α-In2Se3的晶体管中的畴结构也发生变化。畴演化可能是这些晶体管光响应性退化的主要原因之一。该研究可为未来的研究提供坚实的基础,并且可以考虑在基于二维铁电材料的器件中立即应用。

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