Sindhu Pooja, Prasoon Anupam, Rana Shammi, Ballav Nirmalya
Department of Chemistry, Indian Institute of Science Education and Research (IISER), Dr. Homi Bhabha Road, Pune 411 008, India.
J Phys Chem Lett. 2020 Aug 6;11(15):6242-6248. doi: 10.1021/acs.jpclett.0c01735. Epub 2020 Jul 22.
In this work we report fabrication of high-quality AB- and BA-type heterostructured thin films of cubic Cu(II) (A-type) and tetragonal Cu(I) (B-type) coordination polymers (CPs) on the functionalized Au substrate by the layer-by-layer method. Successful growth of Cu(I)-CP on top of Cu(II)-CP was assigned to be due to the interfacial reduction reaction (IRR). Notably, electrical transport measurements across AB- and BA-type heterostructured thin films revealed rectification of current in opposite directions. We have attributed such an interestingly new observation to the formation of a well-defined interface of Cu(II)-CP and Cu(I)-CP resembling a p-n junction-a hitherto unreported phenomenon that is anticipated to open enormous opportunities for the heterostructured thin films of CPs, likewise celebrated interfaces of oxide heterostructures.
在本工作中，我们报道了通过逐层法在功能化金衬底上制备高质量的立方Cu(II)（A型）和四方Cu(I)（B型）配位聚合物（CPs）的AB型和BA型异质结构薄膜。Cu(I)-CP在Cu(II)-CP之上的成功生长归因于界面还原反应（IRR）。值得注意的是，对AB型和BA型异质结构薄膜的电输运测量揭示了电流在相反方向上的整流。我们将这一有趣的新观察结果归因于形成了类似于p-n结的Cu(II)-CP和Cu(I)-CP的明确界面——这是一种迄今未报道的现象，预计将为CPs的异质结构薄膜带来巨大机遇，类似于备受关注的氧化物异质结构界面。
