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铁电鳍式场效应晶体管中射频/模拟性能及线性品质因数对温度的依赖性:一项模拟研究

Dependence of RF/Analog and Linearity Figure of Merits on Temperature in Ferroelectric FinFET: A Simulation Study.

作者信息

Saha Rajesh, Goswami Rupam, Bhowmick Brinda, Baishya Srimanta

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 2020 Nov;67(11):2433-2439. doi: 10.1109/TUFFC.2020.2999518. Epub 2020 Jun 2.

Abstract

This article presents a simulation study of the impact of variation in temperature on the transfer characteristics and the RF/analog performance like transconductance ( g ), gate capacitance ( C ), cutoff frequency ( f ), and transconductance frequency product (TFP) of the ferroelectric FinFET (Fe-FinFET). In addition, the impact of temperature on the linearity parameters such as higher order harmonics ( g and g ), second- and third-order voltage intercept points (VIP and VIP), third-order power-intercept point (IIP), third-order intermodulation distortion (IMD), and 1-dB compression point is estimated for wide variation of temperature in the Fe-FinFET. It is seen that temperature has a significant impact on the RF/analog and linearity parameters, and these figure of merits (FoMs) are the functions of temperature. Analysis reports that RF/analog parameters are suppressed, whereas the linearity FoMs are improved as temperature changed from 250 to 350 K.

摘要

本文展示了一项关于温度变化对铁电鳍式场效应晶体管(Fe-FinFET)的传输特性以及射频/模拟性能(如跨导(g)、栅极电容(C)、截止频率(f)和跨导频率乘积(TFP))影响的模拟研究。此外,针对Fe-FinFET中温度的大幅变化,估计了温度对线性参数的影响,这些线性参数包括高阶谐波(g和g)、二阶和三阶电压截点(VIP和VIP)、三阶功率截点(IIP)、三阶互调失真(IMD)以及1dB压缩点。可以看出,温度对射频/模拟和线性参数有显著影响,并且这些品质因数(FoM)是温度的函数。分析报告称,当温度从250K变化到350K时,射频/模拟参数受到抑制,而线性品质因数得到改善。

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