Kim Jae-Hun, Lee Jae-Hyoung, Mirzaei Ali, Kim Hyoun Woo, Tan Boon Teoh, Wu Ping, Kim Sang Sub
Department of Materials Science and Engineering, Inha University, Incheon, 22212, Republic of Korea.
Department of Materials Science and Engineering, Shiraz University of Technology, 71557-13876, Shiraz, Iran.
Sci Rep. 2020 Aug 25;10(1):14194. doi: 10.1038/s41598-020-71017-7.
Herein, we report the electrowetting-on-dielectric (EWOD) characteristics of ZnO nanorods (NRs) prepared via the hydrothermal method with different initial Zn concentrations (0.03, 0.07, and 0.1 M). Diameter of the resultant ZnO NRs were 50, 70 and 85 nm, respectively. Contact angle (CA) measurements showed that the Teflon-coated ZnO NRs with diameters of 85 nm prepared from the 0.1 M solution had the highest CA (137°). During the EWOD studies, on the application of a voltage of 250 V, the water CA decreased to 78°, which demonstrates the potential application of this material in EWOD electronics. Furthermore, we explained the relationship between the applied voltage and CA based on the substrate nanostructures and our newly developed NR-on-film wetting model. In addition, we further validated our model by introducing the homo-composite dielectric structure, which is a composite of thin layered ZnO/Teflon and nano-roded ZnO/Teflon.
在此，我们报告了通过水热法制备的不同初始锌浓度（0.03、0.07和0.1 M）的ZnO纳米棒（NRs）的介电电泳（EWOD）特性。所得ZnO NRs的直径分别为50、70和85 nm。接触角（CA）测量表明，由0.1 M溶液制备的直径为85 nm的聚四氟乙烯涂层ZnO NRs具有最高的CA（137°）。在EWOD研究中，施加250 V电压时，水的CA降至78°，这证明了该材料在EWOD电子学中的潜在应用。此外，我们基于基底纳米结构和新开发的膜上纳米棒润湿性模型解释了施加电压与CA之间的关系。此外，我们通过引入均相复合介电结构进一步验证了我们的模型，该结构是薄层ZnO/聚四氟乙烯和纳米棒状ZnO/聚四氟乙烯的复合材料。
