School of Plant and Environmental Sciences, Virginia Tech, Blacksburg, VA, 24061, USA.
College of Agronomy, Shenyang Agricultural University, Shenyang, 110866, People's Republic of China.
Theor Appl Genet. 2020 Nov;133(11):3165-3176. doi: 10.1007/s00122-020-03662-5. Epub 2020 Aug 26.
Two major QTLs associated with low seed coat deficiency of soybean seeds were identified in two biparental populations, and three SNP markers were validated to assist low-SCD natto soybean breeding selection. Soybean seed coat deficiency (SCD), known as seed coat cracking during soaking in the natto production process, is problematic because split or broken beans clog production lines and increases production costs. Development of natto soybean cultivars with low SCD is crucial to support the growth of the natto industry. Unfortunately, information on the genetic control of SCD in soybean, which is desperately needed to facilitate breeding selection, remains sparse. In this study, two F populations derived from V11-0883 × V12-1626 (Pop 1) and V11-0883 × V12-1885 (Pop 2) were developed and genotyped with BARCSoySNP6K Beadchips and F-derived lines were evaluated for SCD in three consecutive years (2016-2018) in order to identify quantitative trait loci (QTLs) associated with low SCD in soybean. A total of 17 QTLs underlying SCD were identified in two populations. Among these, two major and stable QTLs, qSCD15 on chromosome 15 and qSCD20 on chromosome 20, were detected across multiple years. These QTLs explained up to 30.3% of the phenotypic variation for SCD in Pop 1 and 6.1% in Pop 2 across years. Three SNP markers associated with the qSCD20 were validated in additional four biparental populations. The average selection efficiency of low-SCD soybean was 77% based on two tightly linked markers, Gm20_34626867 and Gm20_34942502, and 64% based on the marker Gm20_35625615. The novel and stable QTLs identified in this study will facilitate elucidation of the genetic mechanism controlling SCD in soybean, and the markers will significantly accelerate breeding for low-SCD soybean through marker-assisted selection.
两个与大豆种子低种皮缺陷相关的主效 QTL 已在两个双交群体中被鉴定出来,并验证了三个 SNP 标记,以辅助低 SCD 纳豆大豆的选育选择。大豆种皮缺陷(SCD),即在纳豆生产过程中浸泡时种皮开裂,是一个有问题的现象,因为裂种或破碎的豆子会堵塞生产线并增加生产成本。开发低 SCD 的纳豆大豆品种对于支持纳豆产业的发展至关重要。不幸的是,急需促进选育选择的大豆 SCD 遗传控制信息仍然很少。在这项研究中,从 V11-0883 × V12-1626(Pop1)和 V11-0883 × V12-1885(Pop2)衍生出两个 F 群体,并使用 BARCSoySNP6K Beadchips 进行基因型分析,在连续三年(2016-2018 年)中,对衍生系进行 SCD 评估,以鉴定与大豆低 SCD 相关的数量性状位点(QTL)。在两个群体中鉴定出 17 个与 SCD 相关的 QTL。其中,在多个年份中检测到两个主要且稳定的 QTL,第 15 号染色体上的 qSCD15 和第 20 号染色体上的 qSCD20。这些 QTL 解释了 Pop1 中 SCD 表型变异的 30.3%和 Pop2 中 6.1%。在另外四个双交群体中验证了与 qSCD20 相关的三个 SNP 标记。基于两个紧密连锁的标记 Gm20_34626867 和 Gm20_34942502,低 SCD 大豆的平均选择效率为 77%,基于标记 Gm20_35625615 的选择效率为 64%。本研究中鉴定的新型和稳定的 QTL 将有助于阐明控制大豆 SCD 的遗传机制,并且这些标记将通过标记辅助选择显著加速低 SCD 大豆的选育。