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中子辐射对模块上电子系统的影响。

Neutron radiation effects on an electronic system on module.

作者信息

Lo Presti Domenico, Medina Nilberto H, Guazzelli Marcilei A, Moralles Mauricio, Aguiar Vitor A P, Oliveira José R B, Added Nemitala, Macchione Eduardo L A, Siqueira Paulo de Tarso D, Zahn Guilherme, Genezini Frederico, Bonanno Danilo, Gallo Giuseppe, Russo Salvatore, Sgouros Onoufrios, Muoio Annamaria, Pandola Luciano, Cappuzzello Francesco

机构信息

Dipartimento di Fisica e Astronomia Ettore Majorana, Università di Catania, 95123 Catania, Italy.

Instituto de Fisica, Universidade de São Paulo, 05508-090 São Paulo, Brazil.

出版信息

Rev Sci Instrum. 2020 Aug 1;91(8):083301. doi: 10.1063/5.0010968.

Abstract

The NUMEN (NUclear Matrix Elements for Neutrinoless double beta decay) project was recently proposed with the aim to investigate the nuclear response to Double Charge Exchange reactions for all the isotopes explored by present and future studies of 0νββ decay. The expected level of radiation in the NUMEN experiment imposes severe limitations on the average lifetime of the electronic devices. During the experiments, it is expected that the electronic devices will be exposed to about 10 neutrons/cm/s according to FLUKA simulations. This paper investigates the reliability of a System On Module (SOM) under neutron radiation. The tests were performed using thermal, epithermal, and fast neutrons produced by the Instituto de Pesquisas Energéticas e Nucleares 4.5 MW Nuclear Research Reactor. The results show that the National Instruments SOM is robust to neutron radiation for the proposed applications in the NUMEN project.

摘要

中微子无中微子双β衰变核矩阵元素(NUMEN)项目最近被提出,旨在研究目前及未来0νββ衰变研究中所探索的所有同位素对双电荷交换反应的核响应。NUMEN实验中预期的辐射水平对电子设备的平均寿命施加了严格限制。在实验期间,根据FLUKA模拟,预计电子设备将暴露在约10个中子/厘米/秒的环境中。本文研究了模块式系统(SOM)在中子辐射下的可靠性。测试使用了由能源与核能研究所4.5兆瓦核研究反应堆产生的热中子、超热中子和快中子。结果表明,对于NUMEN项目中提出的应用,国家仪器公司的SOM对中子辐射具有鲁棒性。

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