Nanophotonics and Optoelectronics Research Center, Qian Xuesen Laboratory of Space Technology , China Academy of Space Technology , Beijing 100094 , P. R. China.
Department of Physics and Institute of Materials Science and Engineering , Washington University , St Louis , Missouri 63130 , United States.
ACS Appl Mater Interfaces. 2018 Jul 11;10(27):23344-23352. doi: 10.1021/acsami.8b06427. Epub 2018 Jun 27.
Due to a higher environmental stability than few-layer black phosphorus and a higher carrier mobility than few-layer dichalcogenides, two-dimensional (2D) semiconductor InSe has become quite a promising channel material for the next-generation field-effect transistors (FETs). Here, we provide the investigation of the many-body effect and transistor performance scaling of monolayer (ML) InSe based on ab initio GW-Bethe-Salpeter equation approaches and quantum transport simulations, respectively. The fundamental band gap of ML InSe is indirect and 2.60 eV. The optical band gap of ML InSe is 2.50 eV for the in-plane polarized light, with the corresponding exciton binding energy of 0.58 eV. The ML InSe metal oxide semiconductor FETs (MOSFETs) show excellent performances with reduced short-channel effects. The on-current, delay time, and dynamic power indicator of the optimized n- and p-type ML InSe MOSFETs can satisfy the high-performance and low-power requirements of the International Technology Roadmap for Semiconductors 2013 both down to 3-5 nm gate length in the ballistic limit. Therefore, a new avenue is opened to continue Moore's law down to 3 nm by utilizing 2D InSe.
由于二维(2D)半导体 InSe 的环境稳定性比少层黑磷高,载流子迁移率比少层二硫化物高,因此它成为下一代场效应晶体管(FET)非常有前途的沟道材料。在这里,我们分别通过从头算 GW-Bethe-Salpeter 方程方法和量子输运模拟研究了基于单层(ML)InSe 的多体效应和晶体管性能缩放。ML InSe 的基本带隙为间接带隙,为 2.60 eV。ML InSe 的光学带隙对于面内偏振光为 2.50 eV,相应的激子结合能为 0.58 eV。ML InSe 金属氧化物半导体 FET(MOSFET)具有出色的性能,可减小短沟道效应。优化后的 n 型和 p 型 ML InSe MOSFET 的导通电流、延迟时间和动态功率指标在弹道极限下,栅长降至 3-5nm 时,都可满足国际半导体技术路线图 2013 年的高性能和低功耗要求。因此,通过利用 2D InSe,为继续遵循摩尔定律至 3nm 开辟了一条新途径。