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通过氮等离子体掺杂制备的横向单层二硫化钼同质结器件。

Lateral monolayer MoS homojunction devices prepared by nitrogen plasma doping.

作者信息

Lu Jingjing, Guo Zhenyu, Wang Wenzhao, Lu Jichang, Hu Yishuo, Wang Junhao, Xiao Yonghong, Wang Xiya, Wang Shibo, Zhou Yufei, Zeng Xiangbin

机构信息

School of Optical and Electronic Information, Huazhong University of Science & Technology, Wuhan 430074, People's Republic of China.

出版信息

Nanotechnology. 2021 Jan 1;32(1):015701. doi: 10.1088/1361-6528/abb970.

DOI:10.1088/1361-6528/abb970
PMID:32942263
Abstract

Monolayer MoS possesses good electron mobility, structural flexibility and a direct band gap, enabling it to be a promising candidate for flexible and wearable optoelectronic devices. In this article, the lateral monolayer MoS homojunctions were prepared by a nitrogen plasma selective doping technique. The monolayer MoS thin films were synthesized by chemical vapor deposition and characterized by photoluminescence, atom force microscope and Raman spectroscopy. The electronic and photoelectric properties of the lateral pn and npn homojunctions were discussed. The results showed that the rectifying ratio of the pn homojunction diode is ∼10. As a photodetector of pn homojunction, the optical responsivity is up to 48.5 A W, the external quantum efficiency is 11 301%, the detectivity is ∼10 Jones and the response time is 20 ms with the laser of 532 nm and the reverse bias voltage of 10 V. As a bipolar junction transistor of npn homojunction, the amplification coefficient reached ∼10. A controllable plasma doping technique, compatible with traditional CMOS process, is utilized to realize the monolayer MoS based pn and npn homojunctions, and it propels the potential applications of 2D materials in the electronic, optoelectronic devices and circuits.

摘要

单层二硫化钼具有良好的电子迁移率、结构柔韧性和直接带隙,使其成为柔性和可穿戴光电器件的有前途的候选材料。在本文中,通过氮等离子体选择性掺杂技术制备了横向单层二硫化钼同质结。通过化学气相沉积合成了单层二硫化钼薄膜,并通过光致发光、原子力显微镜和拉曼光谱对其进行了表征。讨论了横向 pn 和 npn 同质结的电学和光电性质。结果表明,pn 同质结二极管的整流比约为 10。作为 pn 同质结的光电探测器,在 532 nm 激光和 10 V 反向偏置电压下,光响应度高达 48.5 A/W,外量子效率为 11301%,探测率约为 10 Jones,响应时间为 20 ms。作为 npn 同质结的双极结型晶体管,放大系数达到约 10。利用与传统 CMOS 工艺兼容的可控等离子体掺杂技术实现了基于单层二硫化钼的 pn 和 npn 同质结,推动了二维材料在电子、光电器件和电路中的潜在应用。

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