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用于柔性逆变器器件阵列的大面积二硫化钼单层膜的替代氟掺杂

Substitutional Fluorine Doping of Large-Area Molybdenum Disulfide Monolayer Films for Flexible Inverter Device Arrays.

作者信息

Chee Sang-Soo, Jang Hanbyeol, Lee Kayoung, Ham Moon-Ho

机构信息

School of Materials Science and Engineering, Gwangju Institute of Science & Technology (GIST), 123 Cheomdangwagi-ro, Buk-gu, Gwangju 61005, Republic of Korea.

出版信息

ACS Appl Mater Interfaces. 2020 Jul 15;12(28):31804-31809. doi: 10.1021/acsami.0c07824. Epub 2020 Jul 2.

Abstract

Reliable and controllable doping of transition metal dichalcogenides (TMDCs) is a mandatory requirement for practical large-scale electronic applications. However, most of the literature on the doping methodologies of TMDCs has focused on -type doping and multilayer TMDC rather than a monolayer one enabling large-scale growth. Herein, we report substitutional fluorine doping of a chemical vapor deposition (CVD)-grown molybdenum disulfide (MoS) monolayer film using a delicate SF plasma treatment. Our SF-treated MoS monolayer shows a -type doping effect with fluorine substitution. The doping concentration is controlled by the plasma treatment time (2-4.9 atom %) while maintaining the structural integrity of the MoS monolayer. Such reliable and tunable substitutional doping is attributed to preventing direct ion bombardment to the MoS monolayer by our gentle plasma treatment system. Finally, we fabricated MoS homojunction flexible inverter device arrays based on the pristine and SF-treated MoS monolayer. A clear switching behavior is observed, and the voltage gain is approximately 8 at an applied of 2 V, which is comparable to that of CVD-grown MoS-based inverter devices reported previously. Obtained voltage gain is also stable even after 500 bending cycles at an applied strain of 0.5%.

摘要

对于实际的大规模电子应用而言,可靠且可控地掺杂过渡金属二硫属化物(TMDCs)是一项必不可少的要求。然而,大多数关于TMDCs掺杂方法的文献都集中在n型掺杂和多层TMDC上,而非能够实现大规模生长的单层TMDC。在此,我们报告了使用精细的SF₆等离子体处理对化学气相沉积(CVD)生长的二硫化钼(MoS₂)单层膜进行替代氟掺杂。我们经SF₆处理的MoS₂单层表现出氟替代的n型掺杂效应。掺杂浓度由等离子体处理时间控制(2 - 4.9原子%),同时保持MoS₂单层的结构完整性。这种可靠且可调的替代掺杂归因于我们温和的等离子体处理系统防止了对MoS₂单层的直接离子轰击。最后,我们基于原始的和经SF₆处理的MoS₂单层制造了MoS₂同质结柔性逆变器器件阵列。观察到了明显的开关行为,并且在施加2 V电压时电压增益约为8,这与先前报道的CVD生长的基于MoS₂的逆变器器件相当。即使在0.5%的施加应变下进行500次弯曲循环后,获得的电压增益也很稳定。

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