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在 70eV、低电子能量以及采用冷电子电离和 NIST 库鉴定概率获得的电子电离质谱的比较。

A comparison of electron ionization mass spectra obtained at 70 eV, low electron energies, and with cold EI and their NIST library identification probabilities.

机构信息

School of Chemistry, Tel Aviv University, Tel Aviv, 6997801, Israel.

Aviv Analytical LTD, 24 Hanagar Street, Hod Hasharon, 4527713, Israel.

出版信息

J Mass Spectrom. 2020 Dec;55(12):e4646. doi: 10.1002/jms.4646.

Abstract

Electron ionization (EI) mass spectra of 46 compounds from several different compound classes were measured. Their molecular ion abundances were compared as obtained with 70-eV EI, with low eV EI (such as 14 eV), and with EI mass spectra of vibrationally cold molecules in supersonic molecular beams (Cold EI). We further compared these mass spectra in their National Institute of Standards and Technology (NIST) library identification probabilities. We found that Low eV EI is not a soft ionization method, and it has little or no influence on the molecular ion relative abundances for large molecules and those with weak or no molecular ions. Low eV EI for compounds with abundant or dominant molecular ions in their 70 eV mass spectra results in the reduction of low mass fragment ions abundances thereby reducing their NIST library identification probabilities thus rarely justifies its use in real-world applications. Cold EI significantly enhances the relative abundance of the molecular ions particularly for large compounds; yet, it retains the low mass fragment ions; hence, Cold EI mass spectra can be effectively identified by the NIST library. Different standard EI ion sources provide different 70 eV EI mass spectra. Among the Agilent technologies ion sources, the "Extractor" exhibits relatively abundant molecular ions compared with the "Inert" ion source, while the "High efficiency source" (HES) provides mass spectra with depleted molecular ions compared with the "Inert" ion source or NIST library mass spectra. These conclusions are demonstrated and supported by experimental data in nine figures and two tables.

摘要

我们测量了来自多个化合物类别的 46 种化合物的电子电离(EI)质谱。比较了它们在 70eV EI、低 eV EI(如 14eV)和超音速分子束中振动冷分子的 EI 质谱(Cold EI)中获得的分子离子丰度。我们还比较了这些质谱在其美国国家标准与技术研究院(NIST)库中的鉴定概率。我们发现,低 eV EI 不是一种软电离方法,对于大分子和弱分子或没有分子离子的化合物,它对分子离子的相对丰度几乎没有影响或没有影响。对于在 70eV 质谱中具有丰富或主要分子离子的化合物,低 eV EI 会导致低质量碎片离子丰度降低,从而降低其 NIST 库鉴定概率,因此很少有理由在实际应用中使用它。Cold EI 显著增强了分子离子的相对丰度,特别是对于大分子;然而,它保留了低质量碎片离子;因此,Cold EI 质谱可以通过 NIST 库有效地识别。不同的标准 EI 离子源提供不同的 70eV EI 质谱。在安捷伦技术的离子源中,“Extracto r”与“惰性”离子源相比,具有相对丰富的分子离子,而“高效源”(HES)与“惰性”离子源或 NIST 库质谱相比,提供了分子离子耗尽的质谱。这一结论通过九张图和两张表中的实验数据得到了证明和支持。

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