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羟基磷灰石涂层中的结构和化学层次结构。

Structural and Chemical Hierarchy in Hydroxyapatite Coatings.

作者信息

Gross Karlis A, Petzold Christiane, Pluduma-LaFarge Liene, Kumermanis Maris, Haugen Håvard J

机构信息

Biomaterials Research Laboratory, Technical University, Faculty of Materials Science and Applied Chemistry, LV-1048 Riga, Latvia.

Leibniz-Institute for New Materials, 66123 Saarbrücken, Germany.

出版信息

Materials (Basel). 2020 Oct 7;13(19):4447. doi: 10.3390/ma13194447.

Abstract

Hydroxyapatite coatings need similarly shaped splats as building blocks and then a homogeneous microstructure to unravel the structural and chemical hierarchy for more refined improvements to implant surfaces. Coatings were thermally sprayed with differently sized powders (20-40, 40-63 and 63-80 µm) to produce flattened homogeneous splats. The surface was characterized for splat shape by profilometry and Atomic force microscopy (AFM), crystal size by AFM, crystal orientation by X-ray diffraction (XRD) and structural variations by XRD. Chemical composition was assessed by phase analysis, but variations in chemistry were detected by XRD and Raman spectroscopy. The resulting surface electrical potential was measured by Kelvin probe AFM. Five levels of structural hierarchy were suggested: the coating, the splat, oriented crystals, alternate layers of oxyapatite and hydroxyapatite (HAp) and the suggested anion orientation. Chemical hierarchy was present over a lower range of order for smaller splats. Coatings made from smaller splats exhibited a greater electrical potential, inferred to arise from oxyapatite, and supplemented by ordered OH ions in a rehydroxylated surface layer. A model has been proposed to show the influence of structural hierarchy on the electrical surface potential. Structural hierarchy is proposed as a means to further refine the properties of implant surfaces.

摘要

羟基磷灰石涂层需要形状相似的扁平片作为构建单元,然后需要一个均匀的微观结构来揭示其结构和化学层次,以便对植入物表面进行更精细的改进。采用不同尺寸的粉末(20 - 40、40 - 63和63 - 80微米)对涂层进行热喷涂,以制备扁平均匀的扁平片。通过轮廓仪和原子力显微镜(AFM)对表面的扁平片形状进行表征,通过AFM对晶体尺寸进行表征,通过X射线衍射(XRD)对晶体取向进行表征,通过XRD对结构变化进行表征。通过相分析评估化学成分,但通过XRD和拉曼光谱检测化学变化。通过开尔文探针AFM测量所得的表面电势。提出了五个结构层次水平:涂层、扁平片、取向晶体、氧磷灰石和羟基磷灰石(HAp)的交替层以及所建议的阴离子取向。对于较小的扁平片,化学层次在较低的有序范围内存在。由较小扁平片制成的涂层表现出更大的电势,推测这是由氧磷灰石引起的,并由再羟基化表面层中有序的OH离子补充。已经提出了一个模型来展示结构层次对表面电势的影响。提出结构层次作为进一步优化植入物表面性能的一种手段。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/e38f/7579587/288482ab9f33/materials-13-04447-g002.jpg

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