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分子间耦合诱导的六方氮化硼上的C自取向

C self-orientation on hexagonal boron nitride induced by intermolecular coupling.

作者信息

Guo Haojie, Martínez-Galera Antonio J, Gómez-Rodríguez Jose M

机构信息

Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Madrid E-28049, Spain.

出版信息

Nanotechnology. 2020 Oct 17;32(2):025711. doi: 10.1088/1361-6528/abbbb2.

DOI:10.1088/1361-6528/abbbb2
PMID:33073772
Abstract

A deep grasp of the properties of the interface between organic molecules and hexagonal boron nitride (h-BN) is essential for the full implementation of these two building blocks in the next generation of electronic devices. Here, using scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS), we report on the geometric and electronic features of C evaporated on a single layer of h-BN grown on a Rh(110) surface under ultra-high vacuum. Two different molecular assemblies of C on the h-BN/Rh(110) surface were observed. The first STM study at room temperature (RT) and at low temperatures (40 K) looked at the molecular orientation of C on a two-dimensional layered material. Intramolecular-resolution images demonstrate the existence of a phase transition of C over the h-BN/Rh(110) surface similar to that found on bulk solid C. At RT molecules exhibit random orientations, while at 40 K such rotational disorder vanishes and they adopt a common orientation over the h-BN/Rh(110) surface. The decrease in thermal energy allows recognition between C molecules, and they become equally oriented in the configuration at which the van der Waals intermolecular interactions are optimized. Bias-dependent submolecular features obtained by means of high-resolution STM images are interpreted as the highest occupied and lowest unoccupied molecular orbitals. STS data showed that fullerenes are electronically decoupled from the substrate, with a negligible charge transfer effect if any. Finally, the very early stages of multilayer growth were also investigated.

摘要

深入了解有机分子与六方氮化硼(h-BN)界面的性质对于在下一代电子器件中充分应用这两种构建块至关重要。在此,我们利用扫描隧道显微镜(STM)和扫描隧道谱(STS),报告了在超高真空下生长在Rh(110)表面的单层h-BN上蒸发的C的几何和电子特征。在h-BN/Rh(110)表面观察到了两种不同的C分子组装形式。首次在室温(RT)和低温(40 K)下进行的STM研究考察了C在二维层状材料上的分子取向。分子内分辨率图像表明,h-BN/Rh(110)表面上C的相变与体相固体C上的相变类似。在室温下,分子呈现随机取向,而在40 K时,这种旋转无序消失,它们在h-BN/Rh(110)表面上采用共同的取向。热能的降低使得C分子之间能够相互识别,并且它们在范德华分子间相互作用得到优化的构型中变得取向一致。通过高分辨率STM图像获得的与偏压相关的亚分子特征被解释为最高占据分子轨道和最低未占据分子轨道。STS数据表明,富勒烯在电子上与衬底解耦,如果存在电荷转移效应,其效应也可忽略不计。最后,还研究了多层生长的早期阶段。

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