Asmi Hicham, Bentayeb Farida, Bouzekraoui Youssef, Bonutti Faustino
Department of Physics, LPHE, Modeling and Simulations, Faculty of Science, Mohammed V University, Rabat, Morocco.
Department of Medical Physics, Academic Hospital of Udine, Udine, Italy.
Indian J Nucl Med. 2020 Jul-Sep;35(3):210-215. doi: 10.4103/ijnm.IJNM_11_20. Epub 2020 Jul 1.
In single-photon emission computed tomography imaging, the presence of scatter degrades image quality. The goal of this study is to optimize the main- and sub-energy windows for triple-energy window (TEW) method using Monte Carlo SImulating Medical Imaging Nuclear Detectors (SIMIND) code for samarium-153 (Sm-153) imaging.
The comparison is based on the Monte Carlo simulation data with the results estimated using TEW method. Siemens Symbia gamma-camera equipped with low-energy high-resolution collimator was simulated for Sm-153 point source located in seven positions in water cylindrical phantom. Three different main-energy window widths (10%, 15%, and 20%) and three different sub-energy window widths (2, 4, and 6 keV) were evaluated. We compared the true scatter fraction determined by SIMIND and scatter fraction estimated using TEW scatter correction method at each position. In order to evaluate the image quality, we used the full width at half maximum (FWHM) computed on the PSF and image contrast using Jaszczak phantom.
The scatter fraction using TEW method is similar to the true scatter fraction for 20% of the main-energy window and 6 keV sub-energy windows. For these windows, the results show that the resolution and contrast were improved.
TEW method could be a useful scatter correction method to remove the scatter event in the image for Sm-153 imaging.
在单光子发射计算机断层扫描成像中,散射的存在会降低图像质量。本研究的目的是使用蒙特卡罗模拟医学成像核探测器(SIMIND)代码,针对钐-153(Sm-153)成像优化三能窗(TEW)方法的主能窗和子能窗。
比较基于蒙特卡罗模拟数据与使用TEW方法估计的结果。对配备低能高分辨率准直器的西门子Symbia伽马相机进行模拟,用于模拟位于水圆柱模体中七个位置的Sm-153点源。评估了三种不同的主能窗宽度(10%、15%和20%)和三种不同的子能窗宽度(2、4和6 keV)。我们比较了在每个位置由SIMIND确定的真实散射分数和使用TEW散射校正方法估计的散射分数。为了评估图像质量,我们使用了基于点扩散函数计算的半高宽(FWHM)以及使用Jaszczak模体计算的图像对比度。
对于20%的主能窗和6 keV的子能窗,使用TEW方法的散射分数与真实散射分数相似。对于这些能窗,结果表明分辨率和对比度得到了改善。
TEW方法可能是一种有用的散射校正方法,可用于去除Sm-153成像中图像的散射事件。