Tai Heng-Chun, Chiang Chao-Ching, Lee Benjamin Tien-Hsi
Department of Mechanical Engineering, National Central University, Taoyuan City 32001, Taiwan, ROC.
ACS Omega. 2020 Oct 8;5(41):26497-26503. doi: 10.1021/acsomega.0c03165. eCollection 2020 Oct 20.
Photoetching of n-type silicon induces a photoluminescent (PL) layer containing nanocrystals on the irradiated surface, usually through band gap absorption (wavelength <1100 nm). Here, we demonstrate the formation of a PL layer restricted to the backside surface, not the irradiated surface, by using a 1064 nm Nd:YAG laser. A nanoscale structure of the PL layer is achieved by merely modifying the electrolyte concentration without adding oxidants. To illustrate the working principle, we submit the hypothesis of a quasi-pn structure based on the theory of a quasi-Fermi level. Because of the "injection current" effect due to the quasi-pn structure, the hole current promoted by free-carrier absorption flows toward the backside surface, leading to anodization. This result is remarkable because anodization of n-type silicon is very hard to achieve with just an etchant in the dark.
n型硅的光刻通常通过带隙吸收(波长<1100nm)在辐照表面诱导出一个包含纳米晶体的光致发光(PL)层。在此,我们展示了通过使用1064nm的Nd:YAG激光在背面而非辐照表面形成一个PL层。仅通过改变电解液浓度而不添加氧化剂就能实现PL层的纳米级结构。为了说明其工作原理,我们基于准费米能级理论提出了准pn结构的假设。由于准pn结构产生的“注入电流”效应,由自由载流子吸收促进的空穴电流流向背面,从而导致阳极氧化。这一结果非常显著,因为仅用蚀刻剂在黑暗中很难实现n型硅的阳极氧化。