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原子力显微镜形貌中的镜像效应可实现针尖重构。

Mirror effect in atomic force microscopy profiles enables tip reconstruction.

机构信息

Instituto de Ciencia Molecular (ICMol), Universidad de Valencia, Paterna, Spain.

出版信息

Sci Rep. 2020 Nov 3;10(1):18911. doi: 10.1038/s41598-020-75785-0.

DOI:10.1038/s41598-020-75785-0
PMID:33144609
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7641199/
Abstract

In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a two-step tip reconstruction process has been developed. First, the tip-to-face angle is estimated by means of an analysis of the convolution error while the tip radius is extracted from the experimental profiles. The results obtained are in good agreement with specification of the tip supplier even though the experiments have been conducted using real distribution of nanoparticles with dispersion in size and aspect ratio. This demonstrates the reliability of our method and opens the door for a more accurate tip reconstruction by using calibration standards.

摘要

在这项工作中,我们重新审视了原子力显微镜中的尖端卷积效应,以说明立方物体在确定尖端形状和尺寸方面的能力。我们使用基于分子的立方纳米粒子作为参考,开发了一种两步尖端重建过程。首先,通过分析卷积误差来估计尖端与表面的夹角,同时从实验轮廓中提取尖端半径。即使实验是使用具有尺寸和纵横比分布的真实纳米粒子进行的,我们得到的结果也与尖端供应商的规格非常吻合。这证明了我们方法的可靠性,并为使用校准标准进行更精确的尖端重建开辟了道路。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/a276153dc8bd/41598_2020_75785_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/fcd8f3b075e3/41598_2020_75785_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/91378ef5500b/41598_2020_75785_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/240a6b30e96a/41598_2020_75785_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/c8ee27cde46e/41598_2020_75785_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/a276153dc8bd/41598_2020_75785_Fig5_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/fcd8f3b075e3/41598_2020_75785_Fig1_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/91378ef5500b/41598_2020_75785_Fig2_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/240a6b30e96a/41598_2020_75785_Fig3_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/c8ee27cde46e/41598_2020_75785_Fig4_HTML.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/2abd/7641199/a276153dc8bd/41598_2020_75785_Fig5_HTML.jpg

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本文引用的文献

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Critical Issues in Scanning Electron Microscope Metrology.扫描电子显微镜计量学中的关键问题
J Res Natl Inst Stand Technol. 1994 Sep-Oct;99(5):641-671. doi: 10.6028/jres.099.059.
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Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip.对大于且锐于原子力显微镜(AFM)探针的物体进行原子力显微镜(AFM)分析。
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Revealing the 3-dimensional shape of atom probe tips by atomic force microscopy.通过原子力显微镜揭示原子探针针尖的三维形状。
Ultramicroscopy. 2018 Nov;194:221-226. doi: 10.1016/j.ultramic.2018.08.010. Epub 2018 Aug 14.
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AFM reconstruction of complex-shaped chiral plasmonic nanostructures.复杂形状手性等离子体纳米结构的原子力显微镜重建
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Algorithms for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation.扫描探针显微镜图像模拟、表面重建和针尖估计算法
J Res Natl Inst Stand Technol. 1997 Jul-Aug;102(4):425-454. doi: 10.6028/jres.102.030.
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Investigation on blind tip reconstruction errors caused by sample features.样本特征导致的盲端重建误差研究。
Sensors (Basel). 2014 Dec 5;14(12):23159-75. doi: 10.3390/s141223159.
8
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9
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Ultramicroscopy. 2014 Nov;146:130-43. doi: 10.1016/j.ultramic.2013.06.022. Epub 2013 Jul 9.
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The conductive properties of single DNA molecules studied by torsion tunneling atomic force microscopy.通过扭转隧道原子力显微镜研究单链 DNA 分子的导电性。
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