Department of Cell and Developmental Biology, John Innes Centre, Norwich, UK.
Methods Mol Biol. 2021;2200:349-369. doi: 10.1007/978-1-0716-0880-7_17.
Atomic force microscopy (AFM) is an indentation technique used to reconstruct the topography of various materials and organisms. AFM can also measure the mechanical properties of the sample. In plants, AFM is applied to image cell wall structural details and measure the elastic properties in the outer cell walls. Here, I describe the use of high-resolution AFM to measure the elasticity of resin-embedded ultrathin sections of leaf epidermal cell walls. This approach allows to access the fine details within the wall matrix and eliminate the influence of the topography or the turgor on mechanical measurements. In this chapter, the sample preparation, AFM image acquisition, and processing of force curves are described. Altogether, these methods allow to measure the wall stiffness and compare different cell wall regions.
原子力显微镜（AFM）是一种压痕技术，用于重建各种材料和生物体的形貌。AFM 还可以测量样品的机械性能。在植物中，AFM 用于成像细胞壁结构细节并测量外壁的弹性特性。在这里，我描述了使用高分辨率 AFM 测量树脂嵌入的超薄叶片表皮细胞壁的弹性。这种方法可以访问壁矩阵中的细微细节，并消除形貌或膨压对机械测量的影响。在本章中，描述了样品制备、AFM 图像采集和力曲线处理。总之，这些方法可以测量壁的刚度并比较不同的细胞壁区域。
