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表面钝化决定了定向碳纳米管的位点选择性生长。

Surface passivation dictated site-selective growth of aligned carbon nanotubes.

作者信息

Sen Supriti, Raju Mula, Jacob Chacko

机构信息

Materials Science Centre, Indian Institute of Technology, Kharagpur, West Bengal, India-721302.

出版信息

Nanoscale. 2020 Nov 26;12(45):23042-23051. doi: 10.1039/d0nr07205b.

Abstract

Surface defects play a significant role in the nucleation and growth of metal particles. Site-selective nucleation of metal catalyst particles, and the subsequent growth of nanostructures, could thus be accomplished by defect engineering. This paper demonstrates the switching of growth sites of vertically aligned multiwall carbon nanotubes (MW-CNTs) by manipulation of surface passivation of the substrate and discusses the possible mechanism behind this selectivity. A complementary growth pattern of CNTs is observed for pre-treatment of identically patterned SiO2/Si substrates under a reducing and non-reducing atmosphere. Variation in the number density of oxygen vacancies on the silicon dioxide surface and the presence of native oxide on the silicon face are believed to dictate the observed selectivity. The CNT architectures mimic the substrate pattern meticulously, exhibiting sharp edges, illustrating a high degree of site selectivity. The chemical state of the substrate surface and catalyst particles has been studied using Auger electron spectroscopy. Electron microscopy and Raman spectroscopy were employed to characterize the synthesized CNTs. The Hermans orientation factor was calculated to quantify the degree of alignment of the MWCNTs. Such facile control over the growth site of aligned carbon nanotubes on a substrate is a desirable aspect of synthesis for easy integration with existing silicon fabrication technology.

摘要

表面缺陷在金属颗粒的成核和生长过程中起着重要作用。因此,通过缺陷工程可以实现金属催化剂颗粒的位点选择性成核以及随后纳米结构的生长。本文通过对衬底表面钝化的操控,展示了垂直排列的多壁碳纳米管(MW-CNTs)生长位点的切换,并讨论了这种选择性背后的可能机制。在还原和非还原气氛下,对相同图案的SiO₂/Si衬底进行预处理时,观察到了碳纳米管的互补生长模式。二氧化硅表面氧空位数量密度的变化以及硅面上原生氧化物的存在被认为决定了所观察到的选择性。碳纳米管结构精确地模仿衬底图案,呈现出尖锐边缘,表明具有高度的位点选择性。利用俄歇电子能谱研究了衬底表面和催化剂颗粒的化学状态。采用电子显微镜和拉曼光谱对合成的碳纳米管进行表征。计算了赫尔曼取向因子以量化多壁碳纳米管的排列程度。对衬底上排列的碳纳米管生长位点进行如此简便的控制,是合成过程中一个理想的方面,便于与现有的硅制造技术集成。

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