Mafi Elham, Calvano Nicholas, Patel Jessica, Islam Md Sherajul, Hasan Khan Md Sakib, Rana Mukti
Division of Physics, Engineering, Mathematics and Computer Sciences, and Optical Science Center for Applied Research, Delaware State University, Dover, DE 19901, USA.
Department of Electrical and Electronic Engineering, Khulna University of Engineering and Technology, Khulna 9203, Bangladesh.
Micromachines (Basel). 2020 Dec 1;11(12):1073. doi: 10.3390/mi11121073.
We report the deposition and characterization of calcium lead titanate (PCT) thin films for pyroelectric detectors. PCT films of thicknesses ranging from ~250 to 400 nm were deposited on both silicon and Si/SiN/Ti/Au substrates at 13 mTorr pressure by 200W radio frequency sputtering in an Ar + O environment. Substrates were kept at variable temperatures during the deposition. The PCT films were annealed at various temperatures in an O environment for 15 min. X-ray diffraction results confirm the polycrystalline nature of these films. Energy dispersive spectroscopy function of scanning electron microscope showed that the films are stoichiometric (CaPb) TiO (Ca/Ti = 0.5, Pb/Ti = 0.66). Temperature dependence of capacitance, pyroelectric current, and pyroelectric coefficient was investigated for different PCT films. Our results show that films deposited at 550 °C and 600 °C demonstrate better quality and larger values of the pyroelectric coefficient. On the other hand, the capacitance fabricated on the PCT films at 550 °C showed the highest value of pyroelectric current and pyroelectric coefficient which were 14 pA and at 30 °C was ~2 µC/mK respectively at a higher temperature. In addition, we used density functional theory to determine the atomic and band structure, real and imaginary parts of dielectric constant and refractive index, and absorption and reflection constants with energy.
我们报道了用于热释电探测器的钛酸钙铅(PCT)薄膜的沉积与表征。通过在Ar + O环境中以200W射频溅射,在13 mTorr压力下,将厚度范围约为250至400 nm的PCT薄膜沉积在硅和Si/SiN/Ti/Au衬底上。沉积过程中衬底保持在不同温度。PCT薄膜在O环境中于不同温度退火15分钟。X射线衍射结果证实了这些薄膜的多晶性质。扫描电子显微镜的能量色散光谱功能表明薄膜是化学计量比的(CaPb)TiO(Ca/Ti = 0.5,Pb/Ti = 0.66)。研究了不同PCT薄膜的电容、热释电电流和热释电系数的温度依赖性。我们的结果表明,在550°C和600°C沉积的薄膜表现出更好的质量和更大的热释电系数值。另一方面,在550°C的PCT薄膜上制备的电容在较高温度下显示出最高的热释电电流值和热释电系数,在30°C时分别为14 pA和约2 µC/mK。此外,我们使用密度泛函理论来确定原子和能带结构、介电常数和折射率的实部和虚部以及能量相关的吸收和反射常数。