Janoschka D, Dreher P, Rödl A, Franz T, Schaff O, Horn-von Hoegen M, Meyer Zu Heringdorf F-J
Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Lotharstrasse. 1, 47057 Duisburg, Germany.
Faculty of Physics and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Lotharstrasse. 1, 47057 Duisburg, Germany.
Ultramicroscopy. 2021 Feb;221:113180. doi: 10.1016/j.ultramic.2020.113180. Epub 2020 Nov 27.
The intrinsically weak signals in ultrafast electron microscopy experiments demand an improvement in the signal-to noise ratio of suitable electron detectors. We provide an experience report describing the installation and operation of a fiber-coupled CMOS based detector in a low energy electron microscope. We compare the detector performance to the traditional multi-channel-plate-based setup. The high dynamic range CMOS detector is capable of imaging spatially localized large intensity variations with low noise. The detector is blooming-free and overexposure appears uncritical. Overall, we find dramatic improvements in the imaging with the fiber-coupled CMOS detector compared to imaging with our previously used multi-channel-plate detector.
超快电子显微镜实验中固有的微弱信号要求改进合适电子探测器的信噪比。我们提供一份经验报告，描述基于光纤耦合互补金属氧化物半导体（CMOS）探测器在低能电子显微镜中的安装与操作。我们将该探测器的性能与传统的基于多通道板的装置进行比较。高动态范围的CMOS探测器能够以低噪声对空间局部的大强度变化进行成像。该探测器无光晕现象，过曝光似乎也无大碍。总体而言，我们发现与使用之前的多通道板探测器成像相比，使用光纤耦合CMOS探测器成像有显著改进。
