Ross Aaron M, Paternò Giuseppe M, Dal Conte Stefano, Scotognella Francesco, Cinquanta Eugenio
Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milan, Italy.
Center for Nano Science and Technology@PoliMi, Istituto Italiano di Tecnologia (IIT), Via Giovanni Pascoli, 70/3, 20133 Milan, Italy.
Materials (Basel). 2020 Dec 16;13(24):5736. doi: 10.3390/ma13245736.
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers-Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1-3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.
在这项工作中,简要回顾了单层过渡金属二硫属化物和少层黑磷光学常数的研究,特别强调了复介电函数和折射率。具体而言,给出了磷烯和少层黑磷复折射率的估计值。通过采用约束克喇末-克朗尼格分析结合转移矩阵方法,从文献报道的差分反射率数据中提取了该材料的复折射率。然后,使用提取的复折射率计算了二氧化硅/硅衬底上1-3层黑磷的反射率对比度。