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原子级薄材料的各向异性复折射率:少层黑磷光学常数的测定

Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus.

作者信息

Ross Aaron M, Paternò Giuseppe M, Dal Conte Stefano, Scotognella Francesco, Cinquanta Eugenio

机构信息

Dipartimento di Fisica, Politecnico di Milano, Piazza Leonardo da Vinci 32, 20133 Milan, Italy.

Center for Nano Science and Technology@PoliMi, Istituto Italiano di Tecnologia (IIT), Via Giovanni Pascoli, 70/3, 20133 Milan, Italy.

出版信息

Materials (Basel). 2020 Dec 16;13(24):5736. doi: 10.3390/ma13245736.

DOI:10.3390/ma13245736
PMID:33339218
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7766739/
Abstract

In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers-Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1-3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.

摘要

在这项工作中,简要回顾了单层过渡金属二硫属化物和少层黑磷光学常数的研究,特别强调了复介电函数和折射率。具体而言,给出了磷烯和少层黑磷复折射率的估计值。通过采用约束克喇末-克朗尼格分析结合转移矩阵方法,从文献报道的差分反射率数据中提取了该材料的复折射率。然后,使用提取的复折射率计算了二氧化硅/硅衬底上1-3层黑磷的反射率对比度。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/c0f12c6612d1/materials-13-05736-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/bee835410efd/materials-13-05736-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/574655639bb4/materials-13-05736-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/2eacfbea124d/materials-13-05736-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/c0f12c6612d1/materials-13-05736-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/bee835410efd/materials-13-05736-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/574655639bb4/materials-13-05736-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/2eacfbea124d/materials-13-05736-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/7555/7766739/c0f12c6612d1/materials-13-05736-g004.jpg

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本文引用的文献

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Optical analysis of the refractive index and birefringence of hexagonal boron nitride from the visible to near-infrared.从可见光到近红外对六方氮化硼的折射率和双折射进行光学分析。
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2D semiconductor nonlinear plasmonic modulators.二维半导体非线性等离子体调制器
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Nanomaterials (Basel). 2018 Sep 14;8(9):725. doi: 10.3390/nano8090725.
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Epitaxial Growth of Atomically Smooth Aluminum on Silicon and Its Intrinsic Optical Properties.硅衬底上原子级平滑铝的外延生长及其本征光学性质。
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