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非晶态和表面晶化铁基薄带的磁光磁滞回线分析

Analysis of Magneto-Optical Hysteresis Loops of Amorphous and Surface-Crystalline Fe-Based Ribbons.

作者信息

Životský Ondřej, Markov Dmitry, Hrabovská Kamila, Buršík Jiří, Jirásková Yvonna

机构信息

Department of Physics, Faculty of Electrical Engineering and Computer Science, VŠB-Technical University of Ostrava, 17. Listopadu 2172/15, 708 00 Ostrava-Poruba, Czech Republic.

CEITEC IPM, Institute of Physics of Materials, AS CR, Zizkova 22, 616 00 Brno, Czech Republic.

出版信息

Materials (Basel). 2020 Dec 31;14(1):141. doi: 10.3390/ma14010141.

Abstract

Three Fe-based ribbon-type samples prepared by a conventional planar flow casting process are studied from the viewpoint of the amorphous FeSiB and partially surface crystallized FeSiB, and FeNbB, microstructures. Surface magnetic properties are investigated by magneto-optical Kerr microscopy, allowing the measurement of a local hysteresis loop from a selected area on the ribbon surface, and simultaneously, a domain structure corresponding to a definite point at the loop. For an amorphous sample, the changes in the slopes of hysteresis loops are related either to the size of the selected surface area, from which the loop is measured, or to the type, width, and movement of magnetic domains through this area. In the first case, the resizing of the area simulates an effect of changing the diameter of the incident laser beam on the magneto-optical properties of the ribbon. In the latter case, the observed wide-curved and fingerprint domains are responsible for markedly different shapes of the hysteresis loops at lower magnetic fields. If the surface is crystallized, the magnetic properties are more homogenous, showing typical one-jump magnetization reversal with less dependence on the size of the surface area. The magneto-optical experiments are completed by transmission electron microscopy and magnetic force microscopy.

摘要

从非晶态FeSiB、部分表面结晶的FeSiB以及FeNbB微观结构的角度,研究了通过传统平面流铸工艺制备的三种铁基带状样品。通过磁光克尔显微镜研究表面磁性能,从而能够测量带状表面选定区域的局部磁滞回线,同时测量与回线上某一定点对应的磁畴结构。对于非晶态样品,磁滞回线斜率的变化要么与测量回线所选取的表面区域大小有关,要么与穿过该区域的磁畴类型、宽度和移动有关。在第一种情况下,区域大小的调整模拟了改变入射激光束直径对带状材料磁光性能的影响。在第二种情况下,观察到的宽曲线和指纹状磁畴是导致较低磁场下磁滞回线形状明显不同的原因。如果表面结晶,磁性能会更加均匀,呈现典型的单跳磁化反转,且对表面积大小的依赖性较小。磁光实验通过透射电子显微镜和磁力显微镜完成。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/5d8c/7796431/dbfb6e686e76/materials-14-00141-g001.jpg

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